Center for Nonlinear Optics and Materials

1
Center for Nonlinear Optics and Materials

• Dr. Alton Williams, Director
• Voice [phone]
• Fax [phone]
• E-Mail acwilliams_at_prodigy.net
• Mailing Address
• P.O. Box 1268
• Normal, AL 35762

Citizenship U.S.A.
2
Research Capabilities

• Lens Design
• Fiber Optics
• X-Ray Optics
• Growth of NLO Materials

3
Faculty and Specialties

• Dr. M. D. AggarwalBulk Crystal Growth from Melt
  (Czochralski and Bridgman Stockbarger Techniques)
  Nonlinear Optical Materials, Ni-Based
  Superalloys, Solid State Devices Ion
  Implantation,Microgravity Research Tel (256)
  851-8132
  E-mail
  maggarwal_at_aamu.eduCitizenship U.S.A
• Dr. K. X. HeThin Film, Ultrafast Nonlinear
  Optics, Characterization of Nonlinear Material
  Tel [phone]
  
  E-mailkhe_at_aamu.eduPermanent Resident U.S.A.

4
Faculty and Specialties

• Dr. R. B. LalSolid State Physics, Crystal
  Growth, Materials Science Microgravity Research,
  Growth of Organic Materials, Materials
  Chracterization Tel [phone]
  
  E-mail rlal_at_aamu.eduCitizenship U.S.A.
• Dr. B. R. ReddyOptics and Laser Spectroscopy
  Tel [phone]
  
  E-mail brreddy_at_aamu.eduPermanent Resident
  U.S.A.

5
Faculty and Specialties

• Dr. A. SharmaSmart structures, Fiber-Optic
  Sensors, Nonlinearfiber-optics, Spectroscopy,
  Laser sensing of Atmospheric PollutantsTel
  [phone]
  E-mail
  aamaxs01_at_aamu.eduCitizenship India
• Dr. A. TanAtmospheric, Planetary and Space
  Physics Satellite Fragmentation and Orbital
  Debris Tel [phone]
  
  E-mail atan_at_aamu.eduCitizenship U.S.A.

6
Faculty and Specialties

• Dr. J. C. WangCrystal Growth Theory and Modeling
  Tel [phone]
  E-mail
  jwang_at_aamu.eduCitizenship U.S.A.
• Dr. W.S. Wang
  Crystal Growth and
  Characterization Tel(256)
  851-8121
  E-mail
  wswang_at_aamu.edu
  Citizenship U.S.A.
• Dr. A. WilliamsLens Design, Fiber Optics, X-Ray
  Optics Tel [phone]
  
  E-mail acwilliams_at_prodigy.net Citizenship
  U.S.A.

7
Major Equipment (gt100K)

• Czochralski Crystal Puller with Motor
• Argon-Ion based Picosecond/Femtosecond System
  with (I)
• 3290 Cavity Dumpers
• EPR Spectrometer System
• JEOL-JMS-6400 Scanning Electron Microscope
• Continuously tunable TE/CO2 Laser, including all
  optics,
• power supply and tuning