Photolithography - PowerPoint PPT Presentation

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Photolithography

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Photolithography D. Boolchandani Department of ECE Malaviya National Institute of Technology – PowerPoint PPT presentation

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Title: Photolithography


1
Photolithography
  • D. Boolchandani
  • Department of ECE
  • Malaviya National Institute of Technology
  • Jaipur

2
Photolithography
  • In a microelectronic circuit, all the circuit
    elements (resistors, diodes, transistors, etc.)
    are formed in the top surface of a wafer (usually
    silicon).
  • These circuit elements are interconnected in a
    complex, controlled, patterned manner.
  • Consider the simple case of a silicon p-n
    junction diode with electrical contacts to the p
    and n sides on the top surface of the wafer.

3
Photolithography
  • Silicon p-n junction diode with both electrical
    contacts on the top surface of the wafer
  • Can you draw the diode symbol on this diagram?

4
Photolithography
  • In order to produce a microelectronic circuit,
    portions of a silicon wafer must be doped with
    donors and/or acceptors in a controlled,
    patterned manner.
  • Holes or windows must be cut through insulating
    thin films in a controlled, patterned manner.
  • Metal interconnections (thin film wires) must
    be formed in a controlled, patterned manner.
  • The process by which patterns are transferred to
    the surface of a wafer is called photolithography.

5
Photolithography
  • Consider the fabrication of a silicon p-n
    junction diode with both electrical contacts on
    the top surface of the wafer

6
Photolithography
  • We start with a bare silicon wafer and oxidize
    it. (The bottom surface also gets oxidized, but
    well ignore that.)

7
Photolithography
  • We first need to open a window in the SiO2
    through which we can diffuse a donor dopant
    (e.g., P) to form the n-type region

8
Photolithography
  • The starting point for the photolithography
    process is a mask.
  • A mask is a glass plate that is coated with an
    opaque thin film (often a metal thin film such as
    chromium).
  • This metal film is patterned in the shape of the
    features we want to create on the wafer surface.

9
Photolithography
  • For our example, our mask could look like this

opaque metal,e.g.,Cr
Cross section
Top view
10
Photolithography
  • Recall that we start with a bare silicon wafer
    and oxidize it. (The bottom surface also gets
    oxidized, but well ignore that.)

11
Photolithography
  • The wafer is next coated with photoresist.
  • Photoresist is a light-sensitive polymer.
  • We will initially consider positive photoresist
    (more about what this means soon).
  • Photoresist is usually spun on.
  • For this step, the wafer is held onto a support
    chuck by a vacuum.
  • Photoresist is typically applied in liquid form
    (dissolved in a solvent).
  • The wafer is spun at high speed (1000 to 6000
    rpm) for 20 to 60 seconds to produce a thin,
    uniform film, typically 0.3 to 2.5 mm thick.

12
Photolithography
  • After coating with photoresist, the wafer looks
    like this

13
Photolithography
  • The wafer is baked at 70 to 90C (soft bake or
    pre-bake) to remove solvent from the photoresist
    and improve adhesion.

14
Photolithography
  • The mask is aligned (positioned) as desired on
    top of the wafer.

15
Photolithography
  • The photoresist is exposed through the mask
    with UV light. UV light breaks chemical bonds in
    the photoresist.

16
Photolithography
  • The photoresist is developed by immersing the
    wafer in a chemical solution that removes
    photoresist that has been exposed to UV light.

17
Photolithography
  • The wafer is baked again, but at a higher
    temperature (120 to 180C). This hard bake or
    post-bake hardens the photoresist.

18
Photolithography
  • The unprotected SiO2 is removed by etching in a
    chemical solution containing HF (hydrofluoric
    acid), or by dry etching in a gaseous plasma,
    containing CF4 , for example.

19
Photolithography
  • The photoresist has done its job and is now
    removed (stripped) in a liquid solvent (e.g.,
    acetone) or in a dry O2 plasma.

20
Photolithography
  • Phosphorous is next diffused through the window
    to form an n-type region. The SiO2 film
    blocks phosphorus diffusion outside the window.

21
Photolithography
  • Another photolithography step must be performed
    in order to open another window in the SiO2 so we
    can make an electrical contact to the p-type
    substrate from the top surface of the wafer.

22
Photolithography
  • The steps will not be shown in detail, but after
    photolithography, SiO2 etching, and photoresist
    stripping, the wafer structure is shown below.

23
Photolithography
  • The wafer surface is next coated with aluminum by
    evaporation or sputtering. The window outlines
    may still be visible.

24
Photolithography
  • Photolithography is used to pattern photoresist
    so as to protect the aluminum over the windows

25
Photolithography
  • What must the mask look like in order to pattern
    the aluminum film? Assume that were still using
    positive photoresist.

26
Photolithography
  • The aluminum is etched where it is not protected
    by photoresist. Wet or dry etchants can be used.

27
Photolithography
  • Then the photoresist is stripped.

28
Photolithography
  • The final step is to anneal (heat treat) the
    wafer at 450C in order to improve the
    electrical contact between the aluminum film and
    the underlying silicon.

29
Photolithography
  • So far we have only considered positive
    photoresists.
  • For positive resists, the resist pattern on the
    wafer looks just like the pattern on the mask
  • There are also negative photoresists.
  • Ultraviolet light crosslinks negative resists,
    making them less soluble in a developer solution.
  • For negative resists, the resist pattern on the
    wafer is the negative of the pattern on the mask.

30
Photolithography
  • In order to align a new pattern to a pattern
    already on the wafer, alignment marks are used.
  • Various exposure systems
  • Contact printing,
  • Proximity printing,
  • Projection printing, and
  • Direct step-on-wafer (step-and-repeat
    projection).

31
Photolithography
  • A complete photolithography process (photoresist
    exposure tool developing process) can be
    characterized by the smallest (finest resolution)
    lines or windows that can be produced on a wafer.
  • This dimension is called the minimum feature size
    or minimum linewidth.
  • The limitations of optical lithography are a
    consequence of basic physics (diffraction).

32
Photolithography
  • For a single-wavelength projection
    photo-lithography system, the minimum feature
    size or minimum linewidth is given by the
    Rayleigh criterion
  • l is the wavelength.
  • NA is the numerical aperture, a measure of the
    light-collecting power of the projection lens.
  • k depends on the photoresist properties and the
    quality of the optical system.

33
Photolithography
  • So how do we reduce wmin ?
  • Reduce k.
  • Reduce l.
  • Increase NA.

34
Photolithography
  • Even for the best projection photolithography
    systems, NA is less than 0.8.
  • The theoretical limit for k (the lowest value) is
    about 0.25.

35
Photolithography
  • Lenses with higher NA can produce smaller
    linewidths.
  • This linewidth reduction comes at a price.
  • The depth of focus decreases as NA increases.
  • Depth of focus is the distance that the wafer can
    be moved relative to (closer to or farther from)
    the projection lens and still keep the image in
    focus on the wafer.

36
Photolithography
  • Depth of focus is given by
  • Depth of focus decreases (bad) as l decreases.
  • Depth of focus decreases (bad) as NA increases.

37
Photolithography
  • Numerous light sources are (and will be) used for
    optical lithography

38
Photolithography
  • Complex devices require the photolithography
    process to be carried out over 20 times.
  • Þ over 20 mask levels
  • Any dust on the wafer or mask can result in
    defects. Þ Cleanrooms are required for
    fabrication of complex devices.
  • Even if defects occur in only 10 of the chips
    during each photolithography step, fewer than 50
    of the chips will be functional after a seven
    mask process is completed.
  • How is this yield calculated?

39
Photolithography
  • Other lithographic techniques will play a role in
    the future.
  • Electron beam lithography
  • Ion beam lithography.
  • X-ray lithography.
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