Analog%20Front%20End%20(AFE)%20Boards%20Production%20Testing - PowerPoint PPT Presentation

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Analog%20Front%20End%20(AFE)%20Boards%20Production%20Testing

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AFE Testing - John T. Anderson. 2. Two separate systems for ... Anderson: AFETM, 12-MCM (mother & daughter) redesign, Sanmina, assist with prototype testing ... – PowerPoint PPT presentation

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Title: Analog%20Front%20End%20(AFE)%20Boards%20Production%20Testing


1
Analog Front End (AFE) BoardsProduction Testing
  • John T. Anderson, Fermilab
  • March 22, 2001
  • Test and Calibration Overview
  • Board Testing at DAB3
  • Calibration at Lab 3
  • Test Hardware
  • Test Software
  • Current Allocation of Resources

2
Test and Calibration Overview
  • Two separate systems for testing and calibration
  • Test stands at DAB3 perform production test
  • All boards calibrated relative to each other
    against AFE Test Module
  • DAB3 tests sufficient to insure board will work
    on platform
  • All functions of board are exercised at DAB3
  • Subset of boards taken to Lab3 for absolute
    calibration
  • Lab3 data correlates performance using AFE Test
    Module to response against actual VLPC signals

3
Board Testing at DAB3
  • Five-Step Test Pipeline
  • Inspection Rework
  • Unpowered tests
  • Programming of PLDs and Microcontroller
  • Bench tests of individual functions
  • Analog functionality and relative calibration
    against AFETM
  • Stages 1 2 require minimal equipment
  • Stage 3 requires computer and interfaces
  • Stages 4 5 require significant hardware
    expertise

4
Calibration at Lab 3
  • Lab 3 provides exact model of platform
    connections
  • Lab 3 is difficult environment to work in
  • Physically cramped
  • Lots of electrical noise
  • Necessary for some boards, but impractical to run
    all boards through Lab 3
  • Since all boards are run through AFETM,
    correlation of some boards Lab3 results to their
    AFETM results provides relative calibration of
    all boards.
  • Estimate that 10 to 15 of all boards should go
    through Lab 3 calibration

5
Test Hardware
  • Stage 1 none required
  • Stage 2 DVMs only
  • Stage 3 PC with Lattice and Microchip software
    interfaces
  • Stage 4 PC with Excel/VBA code, Bit 3, VME
    crate, 1553 interface, SASEQ module, Vicor power
    supplies, Rack Monitor, AFE backplane
  • two of these test stands have already been built
    and are in use
  • Stage 5 Same as Stage 4 plus LVDS test setup and
    AFETM mounted in relay rack
  • one of these built but LVDS test setup still not
    codified

6
Test Software
  • Software is largest work remaining
  • Extant Stage 4 software OK for highly trained
    engineers but not usable for efficient production
    testing
  • New software design not required, need work on
    user interface and data logging. Needs to be
    much more automatic than it is now.
  • Subroutines and pieces from which Stage 5
    software could be written exist, and structure
    defined, but not yet coded.
  • If more hands are to be added, this is the place
    to do it.

7
Allocation of Resources
  • Current resource allocation
  • Anderson AFETM, 12-MCM (mother daughter)
    redesign, Sanmina, assist with prototype testing
  • Matulik prototype testing, test procedure
    documentation
  • Zverev prototype testing
  • Rubinov Lab 3
  • Pei/Moua rework/inspection of remaining
    prototypes
  • Sheahan 12-MCM motherboard schematic entry
  • Kubik 12-MCM daughterboard schematic entry
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