Submillimeter Radiation Induced Persistent Photoconductivity in Pb1xSnxTeIn - PowerPoint PPT Presentation

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Submillimeter Radiation Induced Persistent Photoconductivity in Pb1xSnxTeIn

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1 Moscow State University, Moscow, Russia. 2 University of ... One local level pl is formed. for N 1 (up to 103 - 104) s0p3 centers. 2 In2 In In3 ... – PowerPoint PPT presentation

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Title: Submillimeter Radiation Induced Persistent Photoconductivity in Pb1xSnxTeIn


1
Submillimeter Radiation Induced Persistent
Photoconductivity in Pb1-xSnxTe(In)
  • Aleksander Kozhanov1, Dmitry Dolzhenko1, Ivan
    Ivanchik1, Dan Watson2, Dmitry Khokhlov1
  • 1 Moscow State University, Moscow, Russia
  • 2 University of Rochester, Rochester NY, USA

2
Outline
  • 1. Undoped lead telluride-based alloys.
  • 2. Effects appearing upon doping.
  • a) Fermi level pinning effect.
  • b) Persistent photoconductivity.
  • 3. Theoretical models
  • 4. Pb1-xSnxTe(In)-based infrared photodetectors.
  • a) Radiometric parameters.
  • b) Comparison with Si(Sb) and Ge(Ga).
  • c) Spectral response.
  • d) Continuous focal plane array.
  • 5. Summary.

3
Undoped Lead Telluride-Based Alloys
  • PbTe narrow-gap semiconductor
  • 1. Cubic face-centered lattice of the NaCl type
  • 2. Direct gap Eg 190 meV at T 0 K at the
    L-point of the Brillouin zone
  • 3. High dielectric constant ? ? 103.
  • 4. Small effective masses m ? 10-2 me.

4
Pb1-xSnxTe Solid Solutions
Origin of free carriers deviation from
stoikhiometry ? 10-3. As-grown alloys n,p ?
1018-1019 cm-3 Long-term annealing n,p gt 1016
cm-3
5
Effects Appearing upon Doping
Fermi Level Pinning Effect.
PbTe(In), NIn gt Ni
6
Consequences
  • 1. Absolute reproducibility of the sample
    parameters independently of the growth
    technique. Therefore low production costs.
  • 2. Extremely high spatial homogeneity.
  • 3. High radiation hardness (stable to hard
    radiation fluxes up to 1017 cm-2)

7
Shubnikov de Haas Magnetoresistance
Oscillations in PbTe(In)
8
Fermi Level Pinning in the Pb1-xSnxTe(In)
Alloys.
9
Persistent Photoconductivity
Temperature dependence of the sample resistance
R measured in darkness (1-4) and under infrared
illumination (1'-4') in alloys with x 0.22 (1,
1'), 0.26 (2, 2'), 0.27 (3, 3') and 0.29 (4, 4')
10
Photoconductivity Kinetics
Long lifetime of the photoexcited electrons is
due to a barrier between local and extended
electron states DX-like impurity centers.
11
Model of the mixed valence
  • 2In2?In3 In
  • neutr. donor accept.
  • ?ion(left) ?(1) ?(1)
  • ?ion(right) ?(2) ?(1)
  • ?(2) ?(1) U
  • Usually Ugt0
  • Negative-U center Ult0

12
Model for long-term processes
  • Configuration-coordinate diagram
  • Etot Eel Elat
  • (Ei-?)?n ?2/2?0
  • (n 0,1,2)

13
  • E2 ???????? ????????? ?????????
  • E1 ?????????????? ????????? ?????????

14
Alternative explanation
2 In2 ? In In3
s1p2 s2p1 s0p3 ?
s0p1pl2 One local level pl
is formed for N gtgt 1 (up to 103 - 104) s0p3
centers
15
Quenching of the Persistent Photoconductivity
  • 1. Thermal quenching heating to 25 K and cooling
    down too slow process.
  • 2. Microwave quenching application of microwave
    pulses to the samples
  • f 250 MHz, P 0.9 W, ?t 10 ?s
  • Quantum efficiency of the photodetector may be
    increased up to ? 102 in some special regime of
    the microwave quenching.

16
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17
Pb1-xSnxTe(In)-Based Infrared Photodetectors
  • Single photodetector operating in the regime of
    the periodical accumulation and successive fast
    quenching of the photosignal, quantum efficiency
    stimulation regime.
  • operating temperature 4.2 K
  • wavelenghth 18 ?m (defined by the filter)
  • operating rate 3 Hz
  • area 300200 ?m
  • current sensitivity gt 107 A/W
  • minimal power detected lt 10-16 W (sensitivity of
    the measuring electronics was only 10-7 A).

18
Experimental setup
  • 1 - 300 K or 77 K blackbody
  • 2 - 300 K window
  • 3 - 77 K filter
  • 4 - 4.2 filter and a stop aperture
  • 5 - cold filter on the filter wheel
  • 6 - filter wheel
  • 7 - sample
  • 8 - liquid helium can.

19
Comparison with Si(Sb) and Ge(Ga)
l 14 ?m state of the art Si(Sb) BIB
Pb1-xSnxTe(In) photodetector dark current at
the minimal possible bias of 40 mV (red point)
20
Kinetics of Response of the Pb1-xSnxTe(In)
Photodetector at ? 90 ?m and 116 ?m, at 40 mV
Bias
Pb1-xSnxTe(In) SI?103A/W State of the art
Ge(Ga) SI (3.3-3.5) A/W
21
Extremely important
  • E?(90, 116)?m lt Ea
  • Photoresponse is due to excitation from
    metastable excited local states.
  • The cutoff wavelength ?red may be much higher
    than 220 ?m.

22
Photoresponse at 176 ?m and 241 ?m
  • Strong photoresponse at both 176 and 241 ?m
  • ? 241 ?m is higher than ?red 220 ?m
    observed for Ge(Ga)

23
Focal-Plane Continuous Array.
  • Local infrared illumination leads to local
    generation of photoexcited free electrons.
  • Spatial characteristic scale lt 100 ?m

24
Idea of a Readout Technique
  • 1 - semitransparent electrodes
  • 2 - active Pb1-xSnxTe(In) layer
  • 3 - fluoride buffer layer,
  • 4 wide-gap semiconductor layer,
  • 5 - short-wavelength laser
  • 6 - incident infrared radiation flux

25
Summary
  • Pb1-xSnxTe(In) photodetectors have a number of
    advantageous features that allow them to compete
    successfully with the existing analogs
  • Internal accumulation of the incident radiation
    flux,
  • Possibility of effective fast quenching of an
    accumulated signal
  • Microwave stimulation of the quantum efficiency
    up to 102
  • Possibility of realization of a "continuous"
    focal-plane array
  • Possibility of application of a new readout
    technique
  • High radiation hardness
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