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Directly patterning ferroelectric films by nanoimprint lithography with low temperature and low pressure

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National Nano Device Laboratories, Hsinchu, Taiwan. C.Y. Lee ... Used for: Memory, sensors, actuators, optoelectronics. Large-area patterns ... – PowerPoint PPT presentation

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Title: Directly patterning ferroelectric films by nanoimprint lithography with low temperature and low pressure


1
Directly patterning ferroelectric films by
nanoimprint lithography with low temperature and
low pressure
  • K.C. Hsieh and H.L. Chien
  • Department of Materials Science and Engineering,
    National Taiwan University, Taipei, Taiwan
  • C.H. Lin
  • National Nano Device Laboratories, Hsinchu,
    Taiwan
  • C.Y. Lee
  • Department of Materials Science and Engineering,
    National Taiwan University, Taipei, Taiwan
  • Journal of Vacuum Science Technology B 24(6).
    Nov/Dec 2006, p3234-3236.

Joanne Yim EE C235/NSE C203
2
Outline
  • Background
  • Why ferroelectric materials?
  • Conventional nanoimprint lithography
  • Direct nanoimprint on metals
  • Method
  • Gel precursor
  • Au/gel bilayer
  • Results
  • Summary/Questions Remaining

3
Why ferroelectric materials?
  • Apply electric field to induce electric dipole
    moment
  • Used for
  • Memory, sensors, actuators, optoelectronics
  • Large-area patterns
  • Examples BaTiO3, PbZrTiO3

4
Conventional NIL
  • Shape, then harden some soft material into relief
    of desired pattern
  • Transfer pattern to substrate by etching
  • Processing speed/resolution limited by etching

5
Direct nanoimprint previously
  • Semiconductor material
  • Excimer laser-assisted
  • Requires high power and high pressure
  • Metal films
  • 100MPa
  • Imprinted onto soft film
  • DIRECT shape material, not some buffer
  • Must be malleable
  • Use sharper mold to reduce pressure

6
Method 1
  • MOD (metal organic decomposition) solution of
    Pb(Zr0.52Ti0.48)O3 with excess Pb
  • Spin coat 200nm onto Si substrate
  • 120C anneal to remove solvent, make gel
    maximize hardness difference
  • Si mold apply at RT, 10-20MPa
  • Dry _at_ 120C, pyrolyze _at_ 450C, anneal _at_ 650-800C
    to obtain perovskite phase
  • (higher T anneal more complete perovskite
    structure)

7
Method 2
  • FE require some metal contact to apply electric
    field
  • Apply metal thin film and shape along with FE
    layer
  • Better
  • Less sticking
  • Less relaxation after mold release

8
Results FE gel
  • After imprint, features 60nm high, much less
    than 500nm mold height and gel depth
  • gel sticks to mold

9
Results FE gel Au film
  • Depth by AFM
  • 14MPa (top) 90nm
  • 20MPa 300nm

10
Summary/Questions remaining
  • Malleable precursor can be directly imprinted
  • Combining with top metal film improves transfer
  • Thickness of Au film?
  • When will cracking begin?
  • Applicability to other material systems?
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