S'GENTIL, M' KOHLI, A' SEIFERT IR Microsystems, PSEC, Lausanne, CH' - PowerPoint PPT Presentation

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S'GENTIL, M' KOHLI, A' SEIFERT IR Microsystems, PSEC, Lausanne, CH'

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optimization for thick and crack free films. Reduction of time-consuming : ... Crack-free PbZr0.53Ti0.47O3 films (1-5 m) with {1 0 0} oriented perovskite structure ... – PowerPoint PPT presentation

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Title: S'GENTIL, M' KOHLI, A' SEIFERT IR Microsystems, PSEC, Lausanne, CH'


1
PZT Thick Films by Diol Chemical Solution
Deposition.
S.GENTIL, M. KOHLI, A. SEIFERT IR
Microsystems, PSE-C, Lausanne, CH.
  • Frame of this work
  • European project for piezoelectric micro-machined
    ultrasonic transducers (pMUTs) for scanning probe
    devices
  • The goal for IR-Microsystems
  • Developpment of an alternative diol-based
    solution synthesis process compared to 2MOE
    solution fabrication
  • significantly less carcinogenic and toxic
  • - to reduce the global process time
  • With lead zirconate titanate (PZT) films
    propeties optimised

Results Design Of Experiment (DOE) used to
achieve processing optimization for thick and
crack free films Reduction of time-consuming
synthesis time reduced by 50 film
deposition time shortened of about
25. Crack-free PbZr0.53Ti0.47O3 films (1-5 µm)
with 1 0 0 oriented perovskite structure
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