Mapping Nanotechnology Innovations and Knowledge: Global and Longitudinal Patent and Literature Anal

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Mapping Nanotechnology Innovations and Knowledge
Global and Longitudinal Patent and Literature
Analysis

• Hsinchun Chen, Ph.D.
• Director, Artificial Intelligence Lab
• University of Arizona
• Acknowledgement
• National Science Foundation (NSF)

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• About this book
• Reflects recent growth in nanoscale science and
  engineering
• Analyzes an industry expected to reach 1
  trillion by 2015
• Includes analysis of Patent Office databases in
  the US, Europe and Japan

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Knowledge Mapping
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Invisible Colleges and Knowledge Mapping

• Invisible college, which consists of a small
  group of highly productive and networked
  scientists and scholars, is believed to be
  responsible for growth of scientific knowledge
  (Crane, 1972).
• Knowledge Mapping or Science Mapping
  techniques, based on content analysis, citation
  network analysis, and information visualization,
  has become an active area of research that helps
  reveal such an inter-connected, invisible college
  or network of scholars and their seminal
  publications and ideas (Chen, 2003).

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Online Resources for Knowledge Mapping

• Abstracts Indexes MEDLINE (medicine), TOXLINE
  (toxicology), BIOSIS (biology), COMPENDEX
  (engineering and technology), ERIC (education),
  etc.
• Commercial full-text journal articles and digital
  libraries Thomson Scientific Web of Science, ACM
  Digital Library, The IEEE Computer Society
  Digital Library, etc.
• Free full-text articles and e-prints Free
  Medical Journals, HighWire Press, arXiv.org
  service, etc.
• Citation indexing systems and services Thomson
  Science Citation Index, Google Scholar, CiteSeer,
  etc.
• Electronic Theses and Dissertations (ETD)
  Networked Digital Library of Theses and
  Dissertations (NDLTD), etc.
• Patents USPTO, EPO, JPO, etc.
• Business and industry articles and reports
  Forrester, IDC, and Gartner, etc.
• Web sites, forums, blogs, social networking
  sites, etc.

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Units of Analysis and Representations

• Authors or inventors
• Publications and publication outlets
• Institutions
• Countries or regions
• Subject and topic areas
• Timeline

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Knowledge Mapping Analysis Framework

• Text Mining
• Natural Language Processing automatic indexing,
  information extraction
• Content Analysis clustering algorithms,
  self-organizing map (SOM), multi-dimensional
  scaling (MDS), principal component analysis
  (PCA), co-word analysis, PathFinder network
  (PFNET)
• Network Analysis
• Social Network Analysis subgroup detection,
  discovery of pattern of interaction, roles of
  individuals
• Complex Networks network models, topological
  properties, evolving networks
• Information Visualization
• Information Representations 1D, 2D 3D,
  multi-dimensional, tree, network, temporal
• User-interface Interaction overview detail,
  focus context

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Co-authorship Network (Krempel)
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SOM-based Cancer Map (Chen et al.)
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ThemeView (PNL)
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Galaxy visualization (PNL)
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Mapping Nanotechnology Innovations and Knowledge
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Nanotechnology Commercialization Timeline
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Worldwide Nanotechnology Market
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Nanotechnology

• Nanotechnology
• A fundamental technology.
• Critical for a nations technological competence.
  
• Revolutionizes a wide range of application
  domains.
• In recent years, nanotechnology research
  experienced rapid growth
• (Huang et al., 2003) used patent publications
  from the USPTO for the longitudinal analysis of
  this field.
• Many communities have an interest in assessing
  the RD status of nanotechnology.

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Assessing Nanotechnology Research Status

• Patent analysis
• We developed a framework (Huang et al., 2003) to
  systematically assess nanotechnologys research
  status using
• Bibliometric analysis,
• Content map analysis, and
• Citation network analysis.
• Literature analysis
• Bibliometric analysis is the major approach
  (Braun et al., 1997) other methods are seldom
  used in this kind of study.
• There is a lack of research which conduct
  longitudinal analysis of nanotechnology's
  research status in recent years using scientific
  literature.

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USPTO, EPO, and JPO Patent Analysis(Nature
Nanotechnology, 2008, forthcoming)
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Research Objectives
Background and Research Objectives

• Assess the nanotechnology development status
  represented by USPTO, EPO, and JPO patents.
• Compare and contrast the differences in the
  nanotechnology patents in the three repositories.

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Research Design
Research Design
We developed a framework to assess the RD status
of a a science and engineering domain based on
the patents in the three repositories USPTO,
EPO, and JPO.
USPTO dataset
Patent parsing
Data acquisition
Research status analysis
USPTO database
Number of patents
Patent publication
Collected by keywords
EPO dataset
Average number of cites
Patent importance/ strength of a repository
EPO database
EPOJPO patent
Collected by keywords
Topic coverage
Content map
JPO patent
JPO dataset
Citation Network
Knowledge diffusion
Patent status
JPO database
Patent statuschecking
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Data USPTO Patents
Dataset

• Comparing with "full-text" search and
  "title-claims" search, title-abstract search
  provides fewer search results but with higher
  accuracy.
• From title-abstract search
• 5,363 unique patents were collected.
• Submitted by 2,196 assignee institutions, 8,405
  inventors, and 46 countries.

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Data USPTO Patents (cont.)
Dataset

• Top 20 nanotechnology patent assignees (with
  average patent age) and countries based on
  title-abstract search of patents published from
  1976 to 2004

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Data EPO Patents (cont.)
Dataset

• Top 20 nanotechnology patent assignees (with
  average patent age) and countries based on
  title-abstract search of patents published from
  1978 to 2004

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Data JPO Patents (cont.)
Dataset

• Top 20 nanotechnology patent assignees based on
  title-abstract search of patents published from
  1976 to 2004

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Data USPTO, EPO, and JPO Patents
Dataset

• The numbers of nanotechnology patents published
  in USPTO, EPO and JPO by year (log scale)

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Basic Analysis- USPTO Patents by Country
Basic Bibliographic Analysis

• Top 20 nanotechnology patent assignee countries
  in USPTO (title-abstract search) and their
  patents by year, 1976-2004 (log scale)