Acquisition Of An High Resolution Electron Spectrometer for Subnanometer Electron Microscopy, Nanoch

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Acquisition Of An High Resolution Electron
Spectrometer for Subnanometer Electron
Microscopy, Nanocharacterization Research And
Education
D. A. Muller, J. Silcox and E. J. Kirkland,
Cornell University
DMR-0417392
A novel characterization tool This award enabled
the acquisition of an ultra-high-energy-resolution
imaging electron spectrometer for our
atomic-resolution electron microscope. The
primary thrust of research with this new
spectrometer will be to explore how electronic
structure at small length scales affect the
macroscopic, everyday properties of materials.
As a first demonstration, we have used plasmon
tomography to construct three-dimensional images
of silicon nanoparticles in a silicon dioxide
matrix, a materials system of interest to the
semiconductor industry and at a level of detail
and resolution not possible by conventional
methods.
10 nm
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Acquisition Of An High Resolution Electron
Spectrometer for Subnanometer Electron
Microscopy, Nanocharacterization Research And
Education
D. A. Muller, J. Silcox and E. J. Kirkland,
Cornell University
DMR-0417392
Education The instrument funded by this award
has become the main characterization tool for 7
graduate students, and used in the research
projects of 4 undergraduates (including 2 from
NSF-funded REU programs, DMR-0079992 and
EEC-0117770). Student training for this tool
includes a new course on Nanocharacterization. Th
e instrument is part of the Cornell Center for
Materials Science which provides support for
interdisciplinary research and instrument access
to researchers and students across campus as well
as from other universities, and government and
industrial laboratories. We expect demand for
this tool to grow as training proceeds.