Introduction to Powder Diffraction - PowerPoint PPT Presentation

1 / 24
About This Presentation
Title:

Introduction to Powder Diffraction

Description:

The 2 values are directly measured. We know Cu k synchrotron Si calibration ... pattern, we can explore its solution hyperspace, as shown in the diagram. ... – PowerPoint PPT presentation

Number of Views:84
Avg rating:3.0/5.0
Slides: 25
Provided by: rjce
Category:

less

Transcript and Presenter's Notes

Title: Introduction to Powder Diffraction


1
Introduction to Powder Diffraction
  • R J Cernik
  • SR Summer School
  • Chester 2004

2
Powder Diffraction
  • Many hundreds of small crystallites
  • Multiple, superimposed diffraction patterns
  • Real materials
  • Metals, alloys
  • Minerals
  • Drugs, pharmaceutical compounds
  • Fuel cells, catalysts
  • Cement and cementitious materials

3
(No Transcript)
4
(No Transcript)
5
(No Transcript)
6
(No Transcript)
7
(No Transcript)
8
Indexing
  • The 2? values are directly measured
  • We know ? Cu k? synchrotron Si calibration
  • Braggs law 2d sin(?)n ?
  • We know d for each reflection
  • That is all we know
  • With 80 to 200 reflections that is more than
    enough to solve this miserable little problem

9
Wrong! But why?
D spacings Å
3.2
4.5
2.3
Could you re-construct the 3D structure just from
the d spacings written on the cards?
10
This is a problem in inductive reasoning, why is
it so difficult?
  • The unit cell has up to 6 parameters or degrees
    of freedom. Less for high symmetry materials.
    Cubic cells are defined by one parameter,
    orthorhombic cells 3 and monoclinic 4.
  • The maximum 6 parameters will use considerable
    computing resources
  • You only need the cell constant a to generate a
    cubic pattern. If this were reversible, an
    unknown cubic cell could be found from a single
    powder line, which is nonsense since its indices
    wouldnt be known.
  • Instrumental function 2? zero and specimen
    displacement add extra degrees of freedom
  • As 2? increases, the number of reflections also
    increase as the third power. This quickly
    overwhelms even synchrotron resolution, giving
    overlaps that increase rapidly with 2?. Modern
    pattern-decomposition methods help, but resolved
    peaks remain more reliable than those extracted
    from multiple overlaps.

11
More Problems
  • Calculated Qhkl values depend on the second power
    of their indices, becoming increasingly sensitive
    with 2? to small cell changes. This helps cell
    refinement, but not indexing, since the match of
    each obs line to the nearest calc line becomes
    unstable. So as 2? rises, assigned indices are
    increasingly likely to be wrong, even if the cell
    is roughly correct, which for least-squares
    purposes is worse than not using those lines at
    all.
  • Lines beyond the first 20 or 30 contribute little
    indexing information, because they place few
    constraints on possible cells. Thats why one
    cant power through the degrees of freedom
    problem simply by measuring more lines.

12
  • By plotting figure-of-merit against lattice
    parameters for an observed pattern, we can
    explore its solution hyperspace, as shown in the
    diagram.

13
  • Method Space Exhaustive Status Program(s)
    available
  • Zone indexing Parameter No Mature Yes (2)
  • Successive dichotomy Parameter Yes Mature Yes
    (1)
  • Grid search Parameter Yes Semi-mature Yes (1)
  • Combined heuristic Parameter Semi Mature Yes
    (2)
  • Genetic algorithms Parameter No Developing Yes
    (1)
  • Simulated annealing Parameter No Not yet
    tried No
  • Diffusion equation Parameter No Not yet
    tried No
  • Scan/covariance Par. (both) To
    monocl. Developing Yes (1)
  • Index heuristics Index No Mature Yes (2)
  • Index permutation Index Yes Mature Yes (1)
  • Shirley CCP14 ref

14
Decomposition
15
(No Transcript)
16
(No Transcript)
17
Decomposition
18
(No Transcript)
19
Rietveld refinement
20
(No Transcript)
21
(No Transcript)
22
(No Transcript)
23
(No Transcript)
24
(No Transcript)
Write a Comment
User Comments (0)
About PowerShow.com