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Task II Physical Design Tools

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Creation of a new frontier library of 3-D 'interconnect cells' that can be ... two Centers to ensure synergism, enhance collaborations and avoid duplication of efforts ... – PowerPoint PPT presentation

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Title: Task II Physical Design Tools


1
Task II - Physical Design Tools
Task Leader Simon Wong, Stanford Principal
Investigators Stanford Robert Dutton, Giovanni
De Micheli (DT FC) MIT Jacob
White RPI Yannick Le Coz Summary
Statement Creation of a new frontier library of
3-D interconnect cells that can be combined
to generate accurate models and expedite the
synthesis of interconnect networks operating at
multi-GHz clock frequencies.
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Interconnect Focus Center
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Challenges
  • Drastic increase in interconnect network
    complexity, material options and operating
    frequency.
  • Interconnect structures (line, corner, via) are
    more variant than devices (typically, only width
    is varied).
  • High frequency effects need to be accounted for.
  • Coupling effects, especially long range ones
    (e.g., inductive) are difficult to model.
  • Lead to long design cycle and high cost.

Interconnect Focus Center
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Objectives
Approaches
  • Develop accurate interconnect analysis tools
  • Enable the creation of a library of optimized
    interconnect cells for synthesis.
  • Develop approaches for handling massively coupled
    problems
  • A hierarchy of physical design tools for
  • generation of 3-D interconnect structures,
  • high frequency electromagnetic analysis of 3-D
    structures, and
  • generation of approximate circuit models.
  • Integrate the physical design tools with a new
    breed of test structures and extraction
    methodology .
  • Substrate coupling, thermal analysis

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Accurate Generation/Abstraction of 3-D
Interconnect Structures Prof. R. Dutton,
Stanford University
  • Objective
  • Modeling capabilities to systematically
  • capture physical details of interconnects
  • abstract features supporting performance
    modeling.
  • Approach
  • Geometry modeling and associated detailed
    structures derived from layout and abstracted
    process simulation (Task VI) will support a
    hierarchy of simulation and modeling tools
  • materials dependencies (i.e. stress, grains...)
  • meshed as well as lumped modeling tools
  • Milestones
  • define abstraction approach for heterogeneous
    data (i.e. layout TCAD materials properties)
  • Milestones (contd)
  • demonstrate hierarchical abstract of geometry
    across multi-domain structures
  • develop new algorithms that maintain physical
    links with reduced-order models
  • verify accuracy and applicability (Task I) based
    on test structures and circuits

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Automatic Generation of Accurate Circuit Models
Prof. J. White, MIT Prof. R. Dutton, Stanford
  • MILESTONES
  • Wavelet and Precorrected-FFT Acceleration plus
    MOR
  • Accelerated Substrate Noise
  • Accelerated E-M Noise
  • OBJECTIVE
  • 3-D Structure Circuit Model
  • Valid to 100GHZ
  • Analyze Massively Coupled Problems
  • Substrate Noise, E-M Noise, EMC
  • APPROACH
  • Multigrid and Wavelet and Precorrected-FFT based
    Sparsification
  • Novel Integral Formulations
  • Near-Optimal Model-Order Reduction

Full Chip Interconnect
Sparse Circuit Representation
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6
Library of Optimized Interconnect CellsProf. S.
Wong, Stanford University
  • MILESTONES
  • High frequency properties of advanced
    interconnect materials
  • Library of optimized interconnect cells
  • OBJECTIVE
  • Develop a library of optimized interconnect
    cells that are appropriate for synthesis.
  • APPROACH
  • Heavy utilization of the hierarchy of analysis
    tools developed in this task.
  • Experimental Characterization of advanced
    interconnect materials.
  • Incorporation of innovative signal engineering
    (e.g., from Task I and DT FC).

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7
A Multi-Scale Floating Random-Walk Algorithm for
Thermal Analysis of Complex IC-Interconnect
Structures Prof. Yannick L. Le Coz, Rensselaer
Polytechnic Institute
OBJECTIVE Development of an efficient,
multi-scale floating random-walk interface for
the commercial IC-interconnect CAD tool
QuickCapTM. Our application is local thermal
analysis of complex, multilevel IC-interconnect
and transistor structures. APPROACH The complex
matrix of interconnect metal, ILD, and
transistors will be accurately represented over a
3D local domain of interest. Global
material-property averaging techniques will be
developed to describe exterior regions. The
QuickCap capacitance extractor will then be used
to evaluate a thermal-capacitance matrix,
which, upon inversion will yield local
temperatures.
  • MILESTONES (contd.)
  • Verify computational accuracy by means of direct
    comparison with brute-force local solution.
  • Examine parallel-processing techniques to
    ac-celerate solution convergence (should
    additional NYS support become available).

  • MILESTONES
  • Establish matrix-inversion procedures for
    QuickCap capacitance data.
  • Define multi-scale material-property averaging
    tech-niques for global, exterior representation.

Example 3D Floating Random Walk
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Comparison of Device and Interconnect Modeling
Strategies
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Interfaces between Focus Centers
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Collaborations Between Focus Centers
  • Interface at the circuit component level
  • Generate library of optimized interconnect cells
    that are appropriate for synthesis
    (floorplanning)
  • Reduce design cycle
  • Stanford and MIT are involved in both Centers
  • Frequent meeting between the two Centers to
    ensure synergism, enhance collaborations and
    avoid duplication of efforts

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