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Title: Optimizing Semiconductor Yield with Robust WAT and PCM Processes - PowerPoint PPT Presentation
Description: Wafer Acceptance Testing (WAT) and Process Control Monitoring (PCM) are instrumental elements within the semiconductor manufacturing industry. They are crucial tools utilized predominantly by fabless companies that seek to monitor and enhance their yield and defect rates. WAT/PCM is the systematic measurement of various device parameters during different stages of wafer processing. It establishes control over the manufacturing process, leading to better consistency and quality of the final product. This measurement process aims to build a comprehensive database of process information, useful for a variety of process enhancement and control activities. – PowerPoint PPT presentation
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