IC-EMC%20a%20Demonstration%20Freeware%20for%20Predicting%20Electromagnetic%20Compatibility%20of%20Integrated%20Circuits

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IC-EMC a Demonstration Freeware for Predicting
Electromagnetic Compatibility of Integrated
Circuits
Asia-Pacific EMC-Week in Singapore, May 2008

• Alexandre BOYER, Etienne SICARD
• alexandre.boyer_at_insa-toulouse.fr
• http//www.ic-emc.org

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Credits

• European project MEDEA Parachute (2005-2007)
• European project PIDEA EMCPack (2006-2008)
• National project EPEA (2007 2010)

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Summary
1. EMC of IC issues 2. What is IC-EMC 3. IBIS
interface 4. Emission Prediction 5. Near Field
Prediction 6. Susceptibility Prediction 7.
Conclusion
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1. EMC of IC Issues
EMC validated before fabrication
IC-EMC
DESIGN
Architectural Design
Design Entry Design Architect
EMC Simulations Compliance ?
FABRICATION
NO GO
EMC compliant
GO
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2. What is IC-EMC
Why is it free?

• Developed within projects like MEDEA Parachute
  (2005-2007), PIDEA EMCPack (2006-2008), EPEA
  (2007-2010)
• Promotes and defends the European vision of EMC
  of ICs
• Trainings in industry and university

Why is it non-confidential?

• Standard-based tool IBIS (IEC 62014-1), ICEM
  (IEC 62014-3), ICIM (IEC 62433-4),
• Integrated Circuit parameters models from ITRS
  roadmap
• Demonstrator for industrial

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2. What is IC-EMC
A demonstrator for predicting EMC of integrated
circuits

• A simple tool dedicated to predict EMC of ICs
• An electric circuit schematic editor
• An interface to WinSpice analog simulator
• A set of post-processing tools
• A library of EMC/IC elements
• A set of EMC-related goodies

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2. What is IC-EMC
Electric circuit schematic editor
IC, package and PCB model
Basic symbols
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3. IBIS Interface
I/O Buffer Information Specification file editor

• Very important for
• I/O emission prediction
• I/O immunity prediction

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3. IBIS Interface
Package parasitic evaluation
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4. Emission Prediction
Target measurement methods (IEC 61967)

• Predict conducted mode, radiated and near-field
  emission
• Non-confidential and based on standards (ICEM
  model IEC 62433-2)
• Targeted range 1 MHz 10 GHz
• Mature handling of emission prediction in IC-EMC

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4. Emission Prediction
Emission spectrum prediction
Simulation
Measurements
Core Model
Package Model
Probe Model
Test board Model
Time-domain measure
Frequency measurements
Analog Time Domain Simulation
Fourier Transform
Fourier Transform
Compare dBµV vs. Frequency
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4. Emission Prediction
Emission spectrum analysis
ICEM model
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5. Near-field Prediction
LeadPlacement
PackageRLC
Core noiseModel (ICEM)
Time domain Simulation
WinSPICE
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5. Near-field Prediction
ICEM model
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6. Susceptibility Prediction
Target measurement methods (IEC 62132)
Direct Power Injection
Radiated immunity in GTEM
Near-field Immunity

• Only for harmonic disturbances, not for transient
  immunity
• Predict conducted, radiated mode and near-field
  susceptibility
• Non-confidential and based on standards (IBIS,
  ICIM)
• Targeted range 1 MHz 10 GHz

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6. Susceptibility Prediction
Susceptibility simulation flow
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6. Susceptibility Prediction
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7. Conclusion

• An environment for EMC prediction at IC level and
  trainings has been developed
• The tool is free and is based on standard
• Conducted and radiated emission successfully
  predicted on several ICs
• Conducted susceptibility successfully predicted
  on several ICs
• Positive feedback from trainees concerning the
  tool usage for the illustration of EMC concepts
  (80 90 satisfaction rate)
• The demonstration tool and manual are online at
  www.ic-emc.org

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Publications

• E. Sicard "Issues in Electromagnetic
  Compatibility of integrated circuits Emission
  and Susceptibility", in Microelectronics
  Reliability, Volume 45, Issues 9-11 ,
  September-November 2005, Pages 1277-1284
• S. Bendhia, M. Ramdani, E. Sicard,
  Electromagnetic Compatibility of Integrated
  Circuits, book published by Springer, Dec. 2005,
  0-387-26600-3
• E. Sicard, G. Peres "A Novel Software Environment
  for Predicting the Parasitic Emission of
  Integrated Circuits", proceedings of EMC Compo
  05, Munich, Nov. 28-30, 2005
• E. Sicard, "IC-EMC, a software for analysing EMC
  of integrated circuits", 2005 IEEE EMC Symposium,
  8-12 Aug _at_ Navy Pier in Chicago, Computer
  demonstration session.
• A. Boyer, S. Bendhia, E. Sicard, Modeling of a
  Mixed Signal Processor Susceptibility to
  Near-Field Aggression, proceedings of the IEEE
  International Symposium on EMC, Hawaii, Jul 2007.
  
• A. Boyer, M. Fer, L. courau, E. Sicard, Modeling
  of the Susceptibility of 90 nm Input Output
  Buffer, Asia Pacific EMC Week in Singapore, May
  2008