BuiltIn SelfTest Techniques for Dynamic Specifications of ADC and DAC

1
Built-In Self-Test Techniques for Dynamic
Specifications of ADC and DAC

• Presenter Sheng-Tai Chen
• Advisor Jiun-Lang Huang

2
Introduction

• It has become an unavoidable trend to use
  built-in A/D and D/A converters for a
  mixed-signal system-on-chip.
• Testing built-in A/D and D/A converters is a
  difficult task.
• At present, the BIST scheme which have been
  proposed mostly confined to static testing.
• We propose a BIST scheme that uses a linear ramp
  to test the dynamic specifications of A/D and
  D/A converters.

3
The Proposed BIST Architecture
The proposed BIST scheme.
4
Component Descriptions

• Ramp Generator
• Generate a slow ramp signal for static testing
  and dynamic testing.
• ADC/DAC BIST Controller
• Responsible for issuing the suitable control
  signals.
• Mux
• Analog multiplexer.
• deM
• Analog de-multiplexer.
• Memory
• Store the ADC output codes, outputs of the
  comparator, and DAC input patterns.

5
Conclusion

• Proposed BIST architecture do not require complex
  signal generator and digital storage
  oscilloscope.
• BIST scheme are not confined to static
  parameters.
• Also realize the static testing method reported
  in HuOn00.
• Verifying the techniques with hardware setup.