BuiltIn SelfTest Techniques for Dynamic Specifications of ADC and DAC - PowerPoint PPT Presentation

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BuiltIn SelfTest Techniques for Dynamic Specifications of ADC and DAC

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... use built-in A/D and D/A converters for a mixed-signal system-on-chip. ... Responsible for issuing the suitable control signals. Mux. Analog multiplexer. deM ... – PowerPoint PPT presentation

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Title: BuiltIn SelfTest Techniques for Dynamic Specifications of ADC and DAC


1
Built-In Self-Test Techniques for Dynamic
Specifications of ADC and DAC
  • Presenter Sheng-Tai Chen
  • Advisor Jiun-Lang Huang

2
Introduction
  • It has become an unavoidable trend to use
    built-in A/D and D/A converters for a
    mixed-signal system-on-chip.
  • Testing built-in A/D and D/A converters is a
    difficult task.
  • At present, the BIST scheme which have been
    proposed mostly confined to static testing.
  • We propose a BIST scheme that uses a linear ramp
    to test the dynamic specifications of A/D and
    D/A converters.

3
The Proposed BIST Architecture
The proposed BIST scheme.
4
Component Descriptions
  • Ramp Generator
  • Generate a slow ramp signal for static testing
    and dynamic testing.
  • ADC/DAC BIST Controller
  • Responsible for issuing the suitable control
    signals.
  • Mux
  • Analog multiplexer.
  • deM
  • Analog de-multiplexer.
  • Memory
  • Store the ADC output codes, outputs of the
    comparator, and DAC input patterns.

5
Conclusion
  • Proposed BIST architecture do not require complex
    signal generator and digital storage
    oscilloscope.
  • BIST scheme are not confined to static
    parameters.
  • Also realize the static testing method reported
    in HuOn00.
  • Verifying the techniques with hardware setup.
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