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Strong Growth in Failure Analysis Market by 2025

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The failure analysis market is estimated to be valued at USD 3.9 billion in 2020 and is projected to reach USD 5.9 billion by 2025; it is expected to grow at a CAGR of 8.3% from 2020 to 2025. – PowerPoint PPT presentation

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Title: Strong Growth in Failure Analysis Market by 2025


1
MarketsandMarkets Presents

Strong Growth in Failure Analysis Market by
2025 Failure Analysis Market by Equipment
(Optical Microscope, SEM, TEM, FIB, Scanning
Probe Microscope, Dual Beam), Technology (SIMS,
EDX, CMP, FIB, BIM, RIE), Application,
Geography - Forecast to 2025 https//www.marketsa
ndmarkets.com/Market-Reports/failure-analysis-equi
pment-market-149011970.html
2
The failure analysis market is estimated to be
valued at USD 3.9 billion in 2020 and is
projected to reach USD 5.9 billion by 2025 it is
expected to grow at a CAGR of 8.3 from 2020 to
2025. A few key factors driving the growth of
this market include imposition of safety rules
regulations by governments and international
bodies, rise in demand for failure analysis from
the electronics semiconductor industry,
technological advancements in microscopes, and
rising focus on nanotechnology and regenerative
medicine. Browse 100 market data Tables and 37
Figures spread through 164 Pages and in-depth TOC
on "Failure Analysis Market - Forecast to
2025 Download Free PDF Brochure https//www.ma
rketsandmarkets.com/pdfdownloadNew.asp?id14901197
0
3
The Focused Ion Beam (FIB) system market is
expected to grow at the highest CAGR during the
forecast period. FIBs are primarily used for
semiconductor manufacturing. The development of
commercially focused FIBs has led to their
increased applications in the field of material
sciences. In addition to circuit editing and
Transmission Electron Microscopy (TEM) sample
preparation, FIBs can now be used for
microstructural analysis and prototyping
nanomachining. The fastest growth of this segment
can be attributed to the growing adoption of FIB
systems in material science and bioscience
applications.
4
The failure analysis market for Focused Ion
Beam(FIB) technology is expected to grow at the
highest CAGR during the forecast period.
Exponential growth has been observed in research
activities related to material science across the
globe. Research activities require sophisticated
analytical tools to analyze and understand new
materials that possess prominent physical
properties. FIB technology offers both analytical
and patterning capabilities in a single
instrument. Request Free Sample
Pages https//www.marketsandmarkets.com/requestsa
mpleNew.asp?id149011970 The failure analysis
market for material science application is
expected to grow at the highest CAGR during the
forecast period. This is due to the high adoption
of failure analysis equipment for material
science applications. In material science,
Focused Ion Beam (FIB) systems and dual beam
systems are used as a sample preparation tool and
a microscope for micro- and nanosectioning
processes, site-specific transmission electronics
microscope(TEM) sample preparation, deposition,
and polishing of materials as well as their
manipulation.Microscopes are used for the
structural and chemical analysis of materials,
including polymers, metals, alloys, ceramics, and
biomaterials.Optical microscopy and scanning
electron microscope (SEM) are standard techniques
in mineralogical and structural investigations of
geological and archaeological samples.
5
The failure analysis market in APAC is expected
to grow at the highest CAGR during the forecast
period.The rising RD funding for microscopy
research, increasing application of correlative
microscopy in life science and nanotechnology
research,mass production of electronic products
such as smartphones, tablets, sensors, industrial
equipment, wearables, and white goods in China
and Taiwan is expected to accelerate the growth
of the failure analysis market in the
region. The major opportunities for the growth
of failure analysis market include increasing
demand for failure analysis in developing
countries, integration of microscopy with
spectroscopy, and use of Focused Ion Beam (FIB)
systems to study biological samples and
biomaterials.
6
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7
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