Structural analysis of CuIn alloy films with XPS depth profiling by ion etching - PowerPoint PPT Presentation

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Structural analysis of CuIn alloy films with XPS depth profiling by ion etching

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Before Anneal. Indium is high at the surface. ... After Anneal. The signals of Cu and In remain for long time. ... Last part of the depth profile (after anneal) ... – PowerPoint PPT presentation

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