Structural analysis of CuIn alloy films with XPS depth profiling by ion etching - PowerPoint PPT Presentation

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Structural analysis of CuIn alloy films with XPS depth profiling by ion etching

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DATA Processing. 5-point smoothing. every 0.2 eV. Savitzky-Golay method. remove the satellite peak ... This transient time becomes very long after the heat treatment. ... – PowerPoint PPT presentation

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