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Mapping Nanotechnology Innovations and Knowledge: Global and Longitudinal Patent and Literature Anal

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Title: Mapping Nanotechnology Innovations and Knowledge: Global and Longitudinal Patent and Literature Anal


1
Mapping Nanotechnology Innovations and Knowledge
Global and Longitudinal Patent and Literature
Analysis
  • Hsinchun Chen, Ph.D.
  • Director, Artificial Intelligence Lab
  • University of Arizona
  • Acknowledgement
  • National Science Foundation (NSF)

2
  • About this book
  • Reflects recent growth in nanoscale science and
    engineering
  • Analyzes an industry expected to reach 1
    trillion by 2015
  • Includes analysis of Patent Office databases in
    the US, Europe and Japan

3
Knowledge Mapping
4
Invisible Colleges and Knowledge Mapping
  • Invisible college, which consists of a small
    group of highly productive and networked
    scientists and scholars, is believed to be
    responsible for growth of scientific knowledge
    (Crane, 1972).
  • Knowledge Mapping or Science Mapping
    techniques, based on content analysis, citation
    network analysis, and information visualization,
    has become an active area of research that helps
    reveal such an inter-connected, invisible college
    or network of scholars and their seminal
    publications and ideas (Chen, 2003).

5
Online Resources for Knowledge Mapping
  • Abstracts Indexes MEDLINE (medicine), TOXLINE
    (toxicology), BIOSIS (biology), COMPENDEX
    (engineering and technology), ERIC (education),
    etc.
  • Commercial full-text journal articles and digital
    libraries Thomson Scientific Web of Science, ACM
    Digital Library, The IEEE Computer Society
    Digital Library, etc.
  • Free full-text articles and e-prints Free
    Medical Journals, HighWire Press, arXiv.org
    service, etc.
  • Citation indexing systems and services Thomson
    Science Citation Index, Google Scholar, CiteSeer,
    etc.
  • Electronic Theses and Dissertations (ETD)
    Networked Digital Library of Theses and
    Dissertations (NDLTD), etc.
  • Patents USPTO, EPO, JPO, etc.
  • Business and industry articles and reports
    Forrester, IDC, and Gartner, etc.
  • Web sites, forums, blogs, social networking
    sites, etc.

6
Units of Analysis and Representations
  • Authors or inventors
  • Publications and publication outlets
  • Institutions
  • Countries or regions
  • Subject and topic areas
  • Timeline

7
Knowledge Mapping Analysis Framework
  • Text Mining
  • Natural Language Processing automatic indexing,
    information extraction
  • Content Analysis clustering algorithms,
    self-organizing map (SOM), multi-dimensional
    scaling (MDS), principal component analysis
    (PCA), co-word analysis, PathFinder network
    (PFNET)
  • Network Analysis
  • Social Network Analysis subgroup detection,
    discovery of pattern of interaction, roles of
    individuals
  • Complex Networks network models, topological
    properties, evolving networks
  • Information Visualization
  • Information Representations 1D, 2D 3D,
    multi-dimensional, tree, network, temporal
  • User-interface Interaction overview detail,
    focus context

8
Co-authorship Network (Krempel)
9
SOM-based Cancer Map (Chen et al.)
10
ThemeView (PNL)
11
Galaxy visualization (PNL)
12
Mapping Nanotechnology Innovations and Knowledge
13
Nanotechnology Commercialization Timeline
14
Worldwide Nanotechnology Market
15
Nanotechnology
  • Nanotechnology
  • A fundamental technology.
  • Critical for a nations technological competence.
  • Revolutionizes a wide range of application
    domains.
  • In recent years, nanotechnology research
    experienced rapid growth
  • (Huang et al., 2003) used patent publications
    from the USPTO for the longitudinal analysis of
    this field.
  • Many communities have an interest in assessing
    the RD status of nanotechnology.

16
Assessing Nanotechnology Research Status
  • Patent analysis
  • We developed a framework (Huang et al., 2003) to
    systematically assess nanotechnologys research
    status using
  • Bibliometric analysis,
  • Content map analysis, and
  • Citation network analysis.
  • Literature analysis
  • Bibliometric analysis is the major approach
    (Braun et al., 1997) other methods are seldom
    used in this kind of study.
  • There is a lack of research which conduct
    longitudinal analysis of nanotechnology's
    research status in recent years using scientific
    literature.

17
USPTO, EPO, and JPO Patent Analysis(Nature
Nanotechnology, 2008, forthcoming)
18
Research Objectives
Background and Research Objectives
  • Assess the nanotechnology development status
    represented by USPTO, EPO, and JPO patents.
  • Compare and contrast the differences in the
    nanotechnology patents in the three repositories.

19
Research Design
Research Design
We developed a framework to assess the RD status
of a a science and engineering domain based on
the patents in the three repositories USPTO,
EPO, and JPO.
USPTO dataset
Patent parsing
Data acquisition
Research status analysis
USPTO database
Number of patents
Patent publication
Collected by keywords
EPO dataset
Average number of cites
Patent importance/ strength of a repository
EPO database
EPOJPO patent
Collected by keywords
Topic coverage
Content map
JPO patent
JPO dataset
Citation Network
Knowledge diffusion
Patent status
JPO database
Patent statuschecking
20
Data USPTO Patents
Dataset
  • Comparing with "full-text" search and
    "title-claims" search, title-abstract search
    provides fewer search results but with higher
    accuracy.
  • From title-abstract search
  • 5,363 unique patents were collected.
  • Submitted by 2,196 assignee institutions, 8,405
    inventors, and 46 countries.

21
Data USPTO Patents (cont.)
Dataset
  • Top 20 nanotechnology patent assignees (with
    average patent age) and countries based on
    title-abstract search of patents published from
    1976 to 2004

22
Data EPO Patents (cont.)
Dataset
  • Top 20 nanotechnology patent assignees (with
    average patent age) and countries based on
    title-abstract search of patents published from
    1978 to 2004

23
Data JPO Patents (cont.)
Dataset
  • Top 20 nanotechnology patent assignees based on
    title-abstract search of patents published from
    1976 to 2004

24
Data USPTO, EPO, and JPO Patents
Dataset
  • The numbers of nanotechnology patents published
    in USPTO, EPO and JPO by year (log scale)

25
Basic Analysis- USPTO Patents by Country
Basic Bibliographic Analysis
  • Top 20 nanotechnology patent assignee countries
    in USPTO (title-abstract search) and their
    patents by year, 1976-2004 (log scale)

26
Basic Analysis- EPO Patents by Country
Basic Bibliographic Analysis
  • Top 20 nanotechnology patent assignee countries
    in EPO (title-abstract search) and their
    patents by year, 1978-2004 (log scale)

27
Basic Analysis- USPTO Patents by Country Group
Basic Bibliographic Analysis
  • Assignee country group analysis by year,
    1976-2004 (title-abstract search) (log scale)

28
Basic Analysis- EPO Patents by Country Group
Basic Bibliographic Analysis
  • Assignee country group analysis by year,
    1978-2004 (title-abstract search) (log scale)

29
Content Map Analysis (USPTO)
Content Map Analysis
  • USPTO Content Map (1976-1989) (title-abstract
    search)

30
Content Map Analysis (USPTO)
Content Map Analysis
4.18 5.39 6.03 6.51 6.93 7.33
7.75 8.23 8.86 9.32 10.07
NEW

REGION
-0.80 0.41 1.05 1.53 1.95 2.35
2.77 3.25 3.88 4.34 5.09
NEW

REGION
  • USPTO Content Map (1990-1999) (title-abstract
    search)
  • USPTO Content Map (2000-2004) (title-abstract
    search)

31
Findings Content Map (USPTO)
Content Map Analysis
  • From 1976 to 1989, the major research topics of
    USPTO nanotechnology patents included carbon
    atoms, optical fibers, and thin films.
  • From 1990 to 1999, several new research topics
    appeared from 1990 to 1999, including aqueous
    solutions, composite materials, laser beams,
    nucleic acids, optical waveguide, organic
    colvents, reverse osmosis, self-assembled
    monolayer, semiconductor substrate, silicon
    carbide, and substrate surfaces.
  • From 2000 to 2004, the numbers of patents related
    to several topics had increased significantly,
    such as aqueous solutions, composite
    materials, carbon nanotubes, nucleic acids,
    self-assembled monolayer, and thin films.
    Some new topics also became major research topics
    in this time period, such as atomic force
    microscope, clay materials, dielectric
    layers, nanocomposite materials, naphtha
    stream, polymeric materials, and
    semiconductor devices.

32
Citation Network Analysis- USPTO Countries
Citation Network Analysis
33
Citation Network Analysis- EPO Countries
Citation Network Analysis
34
Findings Country Citation Network
Citation Network Analysis
  • In the USPTO dataset, the United States is the
    most significant citation center on the network.
    Japan, Republic of Korea, the United Kingdom,
    China (Taiwan) and Germany are the secondary
    citation centers and constructed a cluster with
    close citations.
  • In the EPO dataset, the United States, France,
    Japan, Germany, and the United Kingdom are large
    citation centers and construct a citation cluster
    on the network.
  • In both repositories, the countries have close
    citation relationships. In EPO most assignee
    countries have more than one citing/cited
    country. In USPTO several countries only have
    citation relationship with the United States.
    Many of the countries that only had citations
    with the United States were relatively new in the
    nanotechnology domain.

35
Thomson SCI Literature Analysis
36
Research Methodology (cont.)
Research Methodology
  • Use content maps to study the active research
    topics and their relations in different time
    spans.
  • Technology topics are extracted from the papers
    abstracts using the Arizona Noun Phraser (Tolle
    and Chen, 2000). The topics are organized by the
    multi-level self-organization map algorithm (Chen
    et al., 1996 Ong et al., 2005), which positions
    similar topics closer together according to their
    co-occurrence patterns.

37
Research Methodology (cont.)
Research Methodology
  • Use citation network analysis to study knowledge
    spillover patterns between countries/regions and
    between institutions.
  • Using network topological measures to infer the
    global characteristics of knowledge spillover in
    the nanotechnology field (Li et al.,
    forthcoming).
  • Visualize the core citation network and identify
    the important patterns in the network
  • citations.

38
Data Thomson SCI Nanotechnology Papers, 1976-2004
Dataset
  • Paper collections
  • 213,847 papers
  • 120,687 first authors
  • 24,468 institutions
  • 4,175 journals/conferences
  • 156 countries/regions
  • The identifiers of the papers that cited or were
    cited by the nanotechnology papers are also
    retrieved.

39
Bibliographic Analysis
I. Bibliographic Analysis
40
Papers by Country/Region
I. Bibliographic Analysis
  • Top 20 countries/regions based on number of
    papers published from 1976 to 2004 (log scale)

41
Papers by Country/Region (cont.)
I. Bibliographic Analysis
  • Top countries/regions (without USA) based on
    number of papers published from 1976 to 2004
    (normal scale)

42
Papers by Institution
I. Bibliographic Analysis
  • Top 20 institutions based on number of papers
    published from 1976 to 2004 (normal scale)

43
Data Productive Countries
Dataset
  • Top 20 countries/regions based on number of
    papers published from 1976 to 2004

44
Data Productive Institutions
Dataset
  • Top 20 institutions based on number of papers
    published from 1976 to 2004

45
Content Map (1990-1999)
II. Content Map Analysis
46
Findings
II. Content Map Analysis
  • Nanotechnology papers published between 1990 and
    1999 covered the topics related to
  • Tools
  • E.g., Scanning Tunneling Microscope,
    Transmission Electron Microscopy, Atomic Force
    Microscope, and so forth.
  • Physical phenomena
  • E.g., Quantum Dots, Single Crystals,
    Self-Assembled Monolayers, Nanomolar
    Concentrations, Porous Silicon, Surface
    Morphologies, and so forth.
  • Experiment environments
  • E.g., Electric Fields, Room Temperatures,
    X-Ray Diffraction, Temperature Dependences,
    Activation Energies, and so forth.

47
Content Map (2000-2004)
II. Content Map Analysis
-1.51 -0.30 0.33 0.81 1.23 1.63
2.05 2.53 3.16 3.62 4.37
NEW

REGION
48
Findings
II. Content Map Analysis
  • Nanotechnology papers published between 2000 and
    2004 also covered the topics related to tools
    (e.g., Scanning Tunneling Microscopy,
    Transmission Electron Microscopy, Atomic Force
    Microscope), physical phenomena (e.g., Quantum
    Dots, Self-Assembled Monolayers), and
    experiment environments (e.g., Aqueous
    Solution, X-Ray Diffraction).
  • The topics on experiment environments became less
    active compared with the other two kinds of
    topics.
  • There were some new topics like X-Ray
    Photoelectron Spectroscopy, Single-Wall Carbon
    Nanotubes, Carbon Nanotubes, Monte Carlo
    Simulations, and Chemical Vapor Deposition.

49
Country Citation Network (1976-2004)
III. Citation Network Analysis
  • The country citation network (1976-2004) consists
    of
  • 66 countries,
  • 348 inter-country citation relations, and
  • 9 self-citation relations.
  • The country citation network contains one
    component.
  • Different countries knowledge influences each
    other directly or indirectly.
  • Much larger clustering coefficient (0.693) than
    the random network (0.162).
  • Some countries tend to form communities from
    thepaper citation perspective.

50
Country Citation Network (1976-2004)
III. Citation Network Analysis
51
Institution Citation Network Analysis
III. Citation Network Analysis
  • The institution citation network consists of
  • 1,237 institutions,
  • 3,075 inter-institution citation relations, and
  • 7 self-citation relations.
  • The institution citation network consists of 20
    components. The giant component contains 1,185
    (95.8) institutions and 3,041 (98.9) relations.
  • Most institutions interact with others directly
    or indirectly.
  • Smaller average path length (4.050) than the
    randomnetwork (4.440).
  • Knowledge can very easily transfer between
    institutions.
  • Much larger clustering coefficient (0.069) than
    the random network (0.004).
  • Research institutions have a very high tendency
    to form citation clusters.

52
Institution Citation Network (1976-2004)
III. Citation Network Analysis
53
India Nano Story
54
Papers by Year
  • The number of papers published from 1976 to 2007.

55
Essential Institutions
  • Top 10 institutions based on number of papers
    published from 1976 to 2004.

56
Most Productive Researchers
  • Top 10 first authors based on number of papers
    published from 1976 to 2004.

57
Most Cited Researchers
  • Top 10 first authors according to the number of
    cites received from all papers in SCI from 1976
    to 2004.

58
The Nano Mapper System
59
System Demo Patent Number Search
60
Search Results Patent Detail
61
System Demo Patent Quick Search
62
Search Results Patent List
63
System Demo Patent Advanced Search
64
System Demo Patent Overall Statistics
65
System Demo Patent Trend Analysis
66
System Demo Patent Trend Analysis (cont.)
67
System Demo Citation Network Analysis
68
System Demo Content Map Analysis
69
Take-home Messages
  • Studying international competitive landscape
    knowledge and innovations
  • The power of the automated knowledge mapping
    approach
  • Prioritized national nanotechnology research
    programs and directions
  • Turning academic research (literature) into
    patents and commercial products
  • Commercialization directions and priorities

70
Hisinchun Chen, Ph.D. hchen_at_eller.arizona.eduAr
tificial Intelligence LabUniversity of
Arizonahttp//ai.arizona.edu
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