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Nonlinear effects in ultrasmall SilicononInsulator ring resonators

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Title: Nonlinear effects in ultrasmall SilicononInsulator ring resonators


1
Nonlinear effects in ultrasmall
Silicon-on-Insulator ring resonators
  • G. Priem, P. Dumon, W. Bogaerts, D. Van
    Thourhout, G. Morthier and R. Baets

2
Outline
  • Introduction ultrafast NL effects
  • Fabrication and experiments in SOI rings
  • Analysis of competing phenomena
  • Conclusions

3
Ultrafast nonlinear effects
  • Much effort into ultrafast nonlinear effects
  • ? all-optical signal processing
  • Kerr effect
  • Mostly theoretically (study of resonant
    enhancement, bistability, ...)
  • Materials e.g. AlGaAs with
  • Two-photon absorption
  • Also experimentally
  • 80 Gb/s modulation (92) in 10 mm SOI wire
    (NICT-UGent-IMEC)
  • Materials e.g. Silicon with

4
Issues
  • Ultrafast nonlinear effects are typically small
  • ? optical confinement (HC systems) !!
  • Two-photon absorption leads to secondary effects
  • Free carriers
  • additional absorption
  • free-carrier dispersion (also called plasma
    effect)
  • Temperature change
  • dispersion

strong, but slow
5
Visual picture
FCA ?a
FCD ?r
conduction band
thermalization
  • thermal dn/dT

2PA ?
valence band
valence band
surface recombination ?carr
Kerr effect n2
thermal relaxation ?th
6
Visual picture
FCA ?a
FCD ?r
conduction band
thermalization
thermal dn/dT
2PA ?
valence band
surface recombination ?carr
valence band
Kerr effect n2
thermal relaxation ?th
  • Which effects dominate the Silicon system?
  • Magnitude of time constants?

7
Fabrication SOI structures
  • Good NL interaction requires strong confinement
  • Transversal wires, PhC waveguides
  • Longitudinal resonators (ring, PhC, DBR, ...)
  • Our best results
  • low-loss SOI ring resonators (R?3?m)
  • Processing (IMEC-Leuven)
  • photo resist deposition
  • 248nm deep UV litho
  • resist development
  • reactive ion etching (RIE)

8
Low-power measurements
  • Example ring resonator (4?m radius)
  • FSR of 21.25 nm
  • BW of 6.03 GHz BW of 3.77 GHz
  • Q 32000 Q 51000
  • splitted resonance

9
High-power CW measurements
  • bistability at 0.27 mW (upper arm shown only)
  • NL loss small compared to NL index effects
  • clearly thermal effects dominate (?n gt 0)

10
Absorption analysis
  • Nonlinear loss (2PA and FCA) gives information
    about carrier concentration and lifetime.
  • Good agreement with other groups
  • Timeconstants carrier dependent 1-10 ns

11
Dispersion analysis
  • thermal effects indeed dominate (lifetime 65 ns)
  • free carrier dispersion also important
  • linear (thermal) term required for good fitting,
    corresponding to linear loss of 0.22 dB/mm

12
Comparison experiment - theory
  • Good overall agreement is obtained.
  • Detailed analysis shows that not all solutions
    are stable!

13
Thermal-carrier pulsations
  • Two opposite refractive index effects with
    different time constants may give rise to
    periodic pulsations.
  • Due to noise quasi-periodic (visualization
    period on oscilloscope not possible)
  • Measurement of standard deviation at 0.76 mW

sim.
exp.
14
Oscilloscope example
?1
exp.
exp.
?2
?1
?2
sim.
sim.
15
Pump-probe experiments
  • FCD based switching (carrier lifetime of 1-10
    ns)
  • Pump signal 10ns pulse, 10001000 pattern,
    peak 0.66mW, 5dB extinction ratio,
    on-resonance (1557 nm)
  • Probe signal CW, off- and on-resonance (1536
    nm)

16
Inverted and non-inverted ? conversion
on-resonance
  • off-resonance

17
Instabilities at higher pump power
on-resonance
  • off-resonance

18
Conclusions (1)
  • Inside SOI resonators, two-photon absorption
    gives rise to secondary effects which are
    dominant.
  • Thermal effects (100ns)
  • Free-carrier effects (1-10ns)
  • We demonstrated
  • Thermal bistability with only 270 ?W
  • FCD based inverted and non-inverted switching
  • Carrier-thermal pulsations limit optical
    switching, but can be used for pulse generation.

19
Conclusions (2)
  • All results were confirmed by simulation.
  • To obtain higher bitrates and avoid unstability,
    carrier extraction by means of a reverse biased
    p-i-n structure
  • Shorter carrier lifetime (below 100 ps)
  • No thermal effects ? no unstability
  • Carrier bistability possible
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