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Title: Next-Gen Final Test Yield Prediction in Semiconductor Manufacturing - PowerPoint PPT Presentation
Description: The semiconductor manufacturing industry is known for its complex processes that span several weeks and involve hundreds of operations. This article proposes a scalable, machine learning-based framework that uses this wealth of data generated during these processes to predict the Final Test (FT) yield at the wafer fabrication stage. The objective of this new framework is to improve operational efficiency and reduce production costs. – PowerPoint PPT presentation
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