TEVATRON%20LONGITUDINAL%20PHASE%20DETECTION%20METER - PowerPoint PPT Presentation

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TEVATRON%20LONGITUDINAL%20PHASE%20DETECTION%20METER

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Title: TEVATRON%20LONGITUDINAL%20PHASE%20DETECTION%20METER


1
TEVATRON LONGITUDINAL PHASE DETECTION METER
  • Aisha Ibrahim

2
OVERALL SYSTEM OBJECTIVE
  • Diagnose the energy oscillation of 36 x 36 proton
    and antiproton bunches as well as study transient
    beam loading
  • Have observed oscillations close to cyclotron
    frequency prior and/or during longitudinal blowup
  • Output modes
  • First mode implemented is similar to the basic
    capabilities of Sampled Bunch Display (SBD)
  • 2 parallel modes will augment module to provide
  • Circular Buffer Turn by turn, Bunch by bunch
    data sets over 10 min
  • Oscillation Amplitude Detector Output an
    envelope of the amplitude of the variation in
    phase

3
THE MATH BEHIND IT
  • Using the strip-line (SL) signal, the phase of
    the fundamental harmonic (RF freq.) of this
    signal respect to the RF reference can be
    estimated by

4
Gate Timing
FPGA
/- 10 Vout 12-bit Serial DAC
fi
MADC
ADC Clock
cos
Q-10bits
x
ADC
(SIMPLIFIED)
I-10bits
Beam pick-up (strip-line)
2- 16MB Circular, LIFO Buffers
F0..n
x
APPL.
sin
Gate Timing
Detected LLRF
VCO/VXO Clock Circuitry
Ethernet Link
ACNET
LLRF Delayed
SysClk
SysClk out
DDS
Status Input
sin cos
LLRF
MDAT
TCLK
AA
5
ANALOG PROCESSING
RC
Q
cos
RC
A D C
x
x
sin
RC
I
RC
(ELABORATED)
6
PRIMARY CHIPS / PARTS
  • AD8138- High Performance, High - Speed
    Differential Amplifier
  • -3 dB Bandwidth of 320 MHz, G 1
  • Fast Settling to 0.01 of 16 ns
  • Slew Rate 1150 V/µs
  • Low Input Voltage Noise of 5 nV/vHz
  • 1 mV Typical Offset Voltage
  • AD835 - 250 MHz, Voltage Output 4-Quadrant
    Multiplier
  • Transfer Function (X1X2)(Y1Y2)/U Z
  • Very Fast Settles to 0.1 of FS in 20 ns
  • High Differential Input Impedance X, Y, and Z
    Inputs
  • Low Multiplier Noise 50 nV/vHz

7
PRIMARY CHIPS / PARTS
  • AD8066 - Low-Cost High-Speed FET Input Amplifier
  • High speed 145 MHz, -3 dB bandwidth (G 1)
  • Low Offset Voltage 1.5 mV Max
  • High Common-Mode Rejection Ratio (CMRR) -100 dB
  • No Phase Reversal
  • AD9201 - Dual Channel 20 MHz 10-Bit Resolution
    CMOS ADC
  • Differential Nonlinearity Error 0.4 LSB
  • Signal-to-Noise Ratio (SNR) 57.8 dB
  • Effective Number of Bits (ENOB) 9.23
  • Pipeline Delay 3 clock cycle latency (min clock
    period 44ns, 50 duty cycle)

8
PRIMARY CHIPS / PARTS
  • ALTERA Cyclones- EPC1C3T144 EPC16Q240
  • Samsung K4S561632E TC75
  • 16M x 16, 133MHz freqmax synchronous Dynamic RAM
  • DAC8043 -12-Bit Serial Input Multiplying CMOS D/A
    Converter
  • Low 61/2 LSB Max INL and DNL
  • Min clock period 240ns

9
PRIMARY CHIPS / PARTS
  • TI MSP430F149
  • 16-Bit Ultra-Low-Power Microcontroller, 60kB256B
    Flash, 2KB RAM, 12 bit ADC, 2 USARTs, HW
    multiplier
  • WIZnet iinChip W3100A-LF
  • Mini network module including hardwired TCP/IP
    chip, Ethernet PHY and other glue logics
  • 10/100 Base T Ethernet (Auto detection) Interface
  • Protocols TCP, UDP, IP, ARP, ICMP, MAC

10
Gate Timing
FPGA
/- 10 Vout 12-bit Serial DAC
fi
MADC
ADC Clock
cos
Q-10bits
x
ADC
(SIMPLIFIED)
I-10bits
Beam pick-up (strip-line)
2- 16MB Circular, LIFO Buffers
F0..n
x
APPL.
sin
Gate Timing
Detected LLRF
VCO/VXO Clock Circuitry
Ethernet Link
ACNET
LLRF Delayed
SysClk
SysClk out
DDS
Status Input
sin cos
LLRF
MDAT
TCLK
AA
11
FPGA TIMING
  • Synchronization of domains
  • SysClk (VXO) is phase locked to LLRF
  • Lock the ADC clock phase to that of the LLRF
  • Unable to reset the PLL post scaling counters in
    the cyclone clock synthesizer section.
  • The phasing can be done with two counters, a
    modulo 8 for the ADCx2 clock and a modulo 14 for
    the RFx2. These counters are reset by the rising
    edge of the output of a flip-flop clocked by RF
    and whose data input is the 8RF/7. At the time
    this flip-flop changes state, the two clock
    trains have a consistent phase.
  • In the PLL, the ADCx2 clock is set to a 22.5 deg
    phase shift with respect to the RFx2 clock to
    avoid coincident edges which would cause
    metastability in the phase detector flip-flop.

12
FPGA TIMING
  • Uniquely identifying position in orbit (i.e.
    bunch or gap ?) is achieved with a set of
    counters
  • Same set of counters allows gate timing to be
    adjusted coarsely by 132nsec (x01) or finely by
    10nsec (x10).

13
FPGA PHASE CALCULATION
  • Calculate the average over N cosine ADC samples
    for each of the 36 bunches
  • Calculate the average over N sine ADC samples
    for each of the 36 bunches
  • Calculate the average over N cosine-pedestal
    samples
  • Calculate the average over N sine-pedestal
    samples
  • Subtract pedestal samples from phase samples
  • Calculate sin² and cos² and compare intensity to
    threshold
  • Calculate arctan(cos/sin) using 45 lookup table
  • Result is a 12-bit phase in degrees
  • Tag bit15 in phase if intensity is less than
    threshold

14
Gate Timing
FPGA
/- 10 Vout 12-bit Serial DAC
MADC
ADC Clock
cos
I-10bits
x
ADC
Q-10bits
Beam pick-up (strip-line)
2- 16MB Circular, LIFO Buffers
x
APPL.
sin
Gate Timing
Detected LLRF
VCO/VXO Clock Circuitry
Ethernet Link
ACNET
LLRF Delayed
SysClk
SysClk out
DDS
Status Input
sin cos
LLRF
MDAT
TCLK
AA
15
OUTPUT 1 SLOWDAC
  • Each phase of the selected bunch is calculated
    every turn then, N samples are averaged.
  • For a user-specified bunch, the resulting average
    phase sent to a 12-bit serial input CMOS DAC.
  • The DAC output is connected to a MADC channel,
    which has an associated ACNET device.
  • Assuming a 128 turn average, this gives an
    effective output rate of 372 KHz.

Slow data
Slow data
I
I-10bits
fi
atan(I/Q)
ADC
Q-10bits
Fast data
Q
16
OUTPUT 2 CIRCULAR BUFFERS
  • The longitudinal phase monitor includes an
    external memory bank, consisting of two 10
    minutes LIFO circular buffers.
  • The format of the buffers consist of sequential
    arrays of 39 16-bit elements
  • an incrementing 32-bit sample count, indicating
    the start of the buffer
  • a 16-bit average phase of the following 36 data
    elements
  • the 16-bit average phase over 128 turns for each
    of the 36 bunches
  • As a result, each array is completed every 1024
    Tevatron cycles and is 39 words long. All data
    values are scaled to 12 bit values.
  • Started and stopped either by a manual trigger or
    by a programmed TCLK event.
  • Once a buffer is stopped, the last MDAT timestamp
    is recorded.
  • If an auto-restart option is enabled, then the
    buffers arm bit will persist. en.
  • However, if the auto-restart option is not
    enabled, the buffer needs to be re-armed to begin
    collecting data again.

I
Slow data
I-10bits
fi
atan(I/Q)
ADC
Fast data
Q-10bits
Q
17
OUTPUT 3 Oscillation Amplitude Detector
  • The same 39 element array is to be processed to
    output an envelope that depicted the magnitude
    of the phase variation for each bunch.
  • This processing would result in limiting the
    bandwidth to ½ Hz.
  • This output mode is still to be better defined.

I
Slow data
I-10bits
fi
atan(I/Q)
ADC
Q-10bits
Fast data
Q
18
What has been done
  • Implemented SLOWDAC mode 12-bit MADC output
    which provides the average phase of a selected
    bunch over 128 turns
  • Took measurements to show linearity when TEV in
    collider mode or uncoalesced mode
  • Implemented pedestal subtraction
  • Implemented TCLK MDAT Decoders
  • Implemented 2 10 minute circular buffers
  • Data format sample count, average of 36 samples,
    1-36 phase averages over 128 turns (1 per bunch)
  • Manual Programmable TCLK event-based
    start/stop/arm/auto-restart controls
  • Investigated ? calibration 30-40 discrepancy
  • Implemented threshold comparison to identify
    non-existent bunches

19
What is next to do
  • Sort out issues of data transfers over
    Ethernet/OAC
  • Investigating 1 noisy spots at 45 and 135
  • Investigate output with WCM signal instead of
    stripline
  • Develop user end application
  • Devise test setup to jiggle one of 36 bunches
  • Oscillation Amplitude Detector
  • Testing and more testing
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