Title: Observation of Pore Scale Liquid Behavior with NIR-Microscopy and Advanced Laser Techniques Markus Tuller and Dani Or Dept. of Plants, Soils and Biometeorology, Utah State University
1Observation of Pore Scale Liquid Behavior with
NIR-Microscopy and Advanced Laser Techniques
Markus Tuller and Dani OrDept. of Plants, Soils
and Biometeorology, Utah State University
2Microscopic Observation of Capillary Condensation
in Glass Micromodels
- A high resolution video microscope (1000x) with
blackwhite CCD camera was used to detect liquid
configurations using IR light (880 nm) emitted
from a LED light source (capitalizing on water
adsorption properties at this wavelength).
- A narrow bandpass interference filter with a
central wavelength of 880 nm was installed on the
CCD camera to increase image contrast for water. - The observations were performed in a temperature
and vapor pressure controlled chamber.
3Environmentally Controlled Observation Chamber
- A LI-COR dew point generator with an accuracy of
0.02 oC was used to control the vapor pressure
within the observation chamber.
- A temperature controller connected to a
thermistor and two thermoelectric Peltier cooling
elements are used to maintain a constant
temperature within the chamber. - Two heat exchangers connected to two closed water
loops are attached to the hot and cool sides
of the Peltier plates. - One loop is guided through the water jacket
surrounding the observation chamber, and the
second loop is connected to a larger water
reservoir.
4Observation of Capillary Menisci in Micro Glass
Beads
- The experimental setup was tested with micro
glass beads having an average diameter of 325 mm. - Observed capillary menisci for various chemical
potentials were compared with calculated menisci
obtained from solutions of the Young-Laplace
equation for pendular water.
5Observation of Capillary Menisci and Liquid
Redistribution in Micro Glass Cells
6Advanced Techniques to Measure Thickness and
Configuration of Adsorbed Liquid Films
- Several micro-scale techniques will be applied to
measure the thickness of adsorbed liquid films. - Currently we are testing the following methods to
measure the structure of surface water on
channeled silica substrates
- EllipsometryFor layers from 0.5 nm to 10 nm
- InterferometryFor layers from 10 nm to 1 mm
- Phase-Contrast MicroscopyResolution down to 2 mm
- Diffraction Analysis
Conceptual Sketch of the Experimental Setup
Laser Interferometer
7Reflectometry for Measurement of Film Thickness
- A miniature fiber optic spectrometer (Ocean
Optics PC2000) with high-performance CCD-array
detector and high-speed A/D converter is used to
measure the reflectance spectrum of thin films
coating solid substrates.
- All measurements are conducted with an incidence
angle perpendicular to the sample surface and
relative to a standard sample with known absolute
reflectance.
8Reflectometry Preliminary Results
9Diffraction Analysis to Determine
LiquidConfigurations within Periodic Structures
- Analysis of the diffraction pattern is used to
determine the average interfacial curvature of
liquid, filling the periodic structure.
Measured Diffraction Patterns for Dry and
Liquid-Filled Periodical Structures