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Lecture 4 Design Rules,Layout and Stick Diagram

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Title: Lecture 1 Introduction to VLSI Design Author: POM Last modified by: POM Created Date: 6/16/2003 6:26:31 AM Document presentation format: On-screen Show – PowerPoint PPT presentation

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Title: Lecture 4 Design Rules,Layout and Stick Diagram


1
Lecture 4 Design Rules,Layout and Stick Diagram
  • Pradondet Nilagupta
  • pom_at_ku.ac.th
  • Department of Computer Engineering
  • Kasetsart University

2
Acknowledgement
  • This lecture note has been summarized from
    lecture note on Introduction to VLSI Design, VLSI
    Circuit Design all over the world. I cant
    remember where those slide come from. However,
    Id like to thank all professors who create such
    a good work on those lecture notes. Without those
    lectures, this slide cant be finished.

3
Roadmap for the term major topics
  • VLSI Overview
  • CMOS Processing Fabrication
  • Components Transistors, Wires, Parasitics
  • Design Rules Layout
  • Combinational Circuit Design Layout
  • Sequential Circuit Design Layout
  • Standard-Cell Design with CAD Tools
  • Systems Design using Verilog HDL
  • Design Project Complete Chip

4
Review - CMOS Mask Layers
  • Determine placement of layout objects
  • Color coding specifies layers
  • Layout objects
  • Rectangles
  • Polygons
  • Arbitrary shapes
  • Grid types
  • Absolute (micron)
  • Scaleable (lambda)

5
Mask Generation
  • Mask Design using Layout Editor
  • user specifies layout objects on different layers
  • output layout file
  • Pattern Generator
  • Reads layout file
  • Generates enlarged master image of each mask
    layer
  • Image printed on glass
  • Step repeat camera
  • Reduces copies image onto mask
  • One copy for each die on wafer
  • Note importance of mask alignment

6
Symbolic Mask Layers
  • Key idea
  • Reduce layers to those that describe design
  • Generate physical layers as needed
  • Magic Layout Editor "Abstract Layers
  • metal1 (blue) - 1st layer metal (equiv. to
    physical layer)
  • Poly (red) - polysilicon (equivalent to physical
    layer)
  • ndiff (green) - n diffusion (combination of
    active, nselect)
  • ntranistor (green/red crosshatch) - combined
    poly, ndiff
  • pdiff (brown) - p diffusion (combination of
    active, pselect)
  • ptransistor (brown/red crosshatch) - combined
    poly, pdiff
  • contacts combine layers, cut mask

7
About Magic
  • Scalable Grid for Scalable Design Rules
  • Grid distance l (lambda)
  • Value is process-dependent l 0.5 X minimum
    transistor length
  • Painting metaphor
  • Paint squares on grid for each mask layer
  • Layers to interact to form components (e.g.
    transistors)

8
Mask Layers in Magic
  • Poly (red)
  • N Diffusion (green)
  • P Diffusion (brown)
  • Metal (blue)
  • Metal 2 (purple)
  • Well (cross-hatching)
  • Contacts (X)

9
Magic User-Interface
  • Graphic Display Window
  • Cursor
  • Box - specifies area to paint
  • Command window (not shown)
  • accepts text commandspaint polypaint
    redpaint ndiffpaint greenwrite
  • prints error status messages

10
Layer Interaction in Magic
  • Transistors - where poly, diffusion cross
  • poly crosses ndiffusion - ntransistor
  • poly crosses pdiffusion - ptransistor
  • Vias - where layers connect
  • Metal 1 connecting to Poly - polycontact
  • Metal 1 connecting to P-Diffusion (normal) - pdc
  • Metal 1 connecting to P-Diffusion (substrate
    contact) - psc
  • Metal 1 connecting to N-Diffusion (normal) - ndc
  • Metal 1 connecting to N-Diffusion (substrate
    contact) - nsc
  • Metal 1 connecting to Metal 2 - via

11
Magic Layers - Example
12
Why we need design rules
  • Masks are tooling for manufacturing.
  • Manufacturing processes have inherent limitations
    in accuracy.
  • Design rules specify geometry of masks which will
    provide reasonable yields.
  • Design rules are determined by experience.

13
Manufacturing problems
  • Photoresist shrinkage, tearing.
  • Variations in material deposition.
  • Variations in temperature.
  • Variations in oxide thickness.
  • Impurities.
  • Variations between lots.
  • Variations across a wafer.

14
Transistor problems
  • Varaiations in threshold voltage
  • oxide thickness
  • ion implanatation
  • poly variations.
  • Changes in source/drain diffusion overlap.
  • Variations in substrate.

15
Wiring problems
  • Diffusion changes in doping -gt variations in
    resistance, capacitance.
  • Poly, metal variations in height, width -gt
    variations in resistance, capacitance.
  • Shorts and opens

16
Oxide problems
  • Variations in height.
  • Lack of planarity -gt step coverage.

metal 2
metal 1
metal 2
17
Via problems
  • Via may not be cut all the way through.
  • Undesize via has too much resistance.
  • Via may be too large and create short.

18
MOSIS SCMOS design rules
  • Designed to scale across a wide range of
    technologies.
  • Designed to support multiple vendors.
  • Designed for educational use.
  • Ergo, fairly conservative.

19
? and design rules
  • ? is the size of a minimum feature.
  • Specifying ? particularizes the scalable rules.
  • Parasitics are generally not specified in ??units?

20
Design Rules
  • Typical rules
  • Minumum size
  • Minimum spacing
  • Alignment / overlap
  • Composition
  • Negative features

21
Types of Design Rules
  • Scalable Design Rules (e.g. SCMOS)
  • Based on scalable coarse grid - l (lambda)
  • Idea reduce l value for each new process, but
    keep rules the same
  • Key advantage portable layout
  • Key disadvantage not everything scales the same
  • Not used in real life
  • Absolute Design Rules
  • Based on absolute distances (e.g. 0.75µm)
  • Tuned to a specific process (details usually
    proprietary)
  • Complex, especially for deep submicron
  • Layouts not portable

22
SCMOS Design Rules
  • Intended to be Scalable
  • Original rules SCMOS
  • Submicron SCMOS-SUBM
  • Deep Submicron SCMOS-DEEP
  • Pictorial Summary Book Fig. 2-24, p. 27
  • Authoritative Reference www.mosis.org

23
SCMOS Design Rule Summary
  • Line size and spacing
  • metal1 Minimum width3l, Minimum Spacing3l
  • metal2 Minimum width3l, Minimum Spacing4l
  • poly Minimum width 2l, Minimum Spacing2l
  • ndiff/pdiff Minimum width 3l, Minimum
    Spacing3l, minimum ndiff/pdiff seperation10l
  • wells minimum width10l, min distance form well
    edge to source/drain5l
  • Transistors
  • Min width3l
  • Min length2l
  • Min poly overhang2l

24
SCMOS Design Rule Summary
  • Contacts (Vias)
  • Cut size exactly 2l X 2l
  • Cut separation minimum 2l
  • Overlap min 1l in all directions
  • Magic approach Symbolic contact layer min. size
    4l X 4l
  • Contacts cannot stack (i.e., metal2/metal1/poly)
  • Other rules
  • cut to poly must be 3l from other poly
  • cut to diff must be 3l from other diff
  • metal2/metal1 contact cannot be directly over
    poly
  • negative features must be at least 2l in size
  • CMP Density rules (AMI/HP subm) 15 Poly, 30
    Metal

25
Design Rule Checking in Magic
  • Design violations displayed as error paint
  • Find which rule is violated with "drc why Poly
    must overhang transistor by at least 2 (MOSIS
    rule 3.3)

26
Scaling Design Rules
  • Effects of scaling down are positive
  • See book, p. 78-79 - if everything scales,
    scaling circuit by 1/x increases performance by x
  • Problem not everything scales proportionally

27
Aside - About MOSIS
  • MOSIS - MOS Implementation Service
  • Rapid-prototyping for small chips
  • Multi-project chip idea - several designs on the
    same wafer
  • Reduced mask costs per design
  • Accepts layout designs via email
  • Brokers fabrication by foundries (e.g. AMI,
    Agilent, IBM, TSMC)
  • Packages chips ships back to designers
  • Our designs will use AMI 1.5µm process (more
    about this later)

28
Aside - About MOSIS
  • Some Typical MOSIS Prices (from www.mosis.org)
  • AMI 1.5µm Tiny Chip (2.2mm X 2.2mm) 1,080
  • AMI 1.5µm 9.4mm X 9.7mm 17,980
  • AMI 0.5µm 0-5mm2 5,900
  • TSMC 0.25µm 0-10mm2 15,550
  • TSMC 0.18µm 0-7mm2 24,500
  • TSMC 100-159mm2 63,250 900 X size
  • MOSIS Educational Program (what we use)
  • AMI 1.5µm Tiny Chip (2.2mm X 2.2mm) FREE
  • AMI 0.5mm Tiny Chip (1.5mm X 1.5mm) FREE

sponsored by Semiconductor Industry Assn.,
Semiconductor Research Corp., AMI, Inc.,
DuPont Photomasks, and MOSIS
29
Layout Considerations
  • Break layout into interconnected cells
  • Use hierarchy to control complexity
  • Connect cells by
  • Abutment
  • Added wires
  • Key goals
  • Minimize size of overall layout
  • Meet performance constraints
  • Meet design time deadlines

30
Hierarchy in Layout
  • Chips are constructed as a hierarchy of cells
  • Leaf cells - bottom of hierarchy
  • Root cells - contains overall cell
  • Example - hypothetical UART
  • Pad frame - ring that contains I/O pads
  • Core - contains logic organized as subcells
  • Shift register
  • FSM
  • Other cells

31
Hierarchy Example
  • Root Cell UART

32
Wires
metal 3
6
metal 2
3
metal 1
3
pdiff/ndiff
3
poly
2
33
Transistors
2
2
3
3
1
5
34
Vias
  • Types of via metal1/diff, metal1/poly,
    metal1/metal2.

4
4
1
2
35
Metal 3 via
  • Type metal3/metal2.
  • Rules
  • cut 3 x 3
  • overlap by metal2 1
  • minimum spacing 3
  • minimum spacing to via1 2

36
Tub tie
4
1
37
Spacings
  • Diffusion/diffusion 3
  • Poly/poly 2
  • Poly/diffusion 1
  • Via/via 2
  • Metal1/metal1 3
  • Metal2/metal2 4
  • Metal3/metal3 4

38
Overglass
  • Cut in passivation layer.
  • Minimum bonding pad 100 ?m.
  • Pad overlap of glass opening 6
  • Minimum pad spacing to unrelated metal2/3 30
  • Minimum pad spacing to unrelated metal1, poly,
    active 15

39
Stick diagrams (1/3)
  • A stick diagram is a cartoon of a layout.
  • Does show all components/vias (except possibly
    tub ties), relative placement.
  • Does not show exact placement, transistor sizes,
    wire lengths, wire widths, tub boundaries.

40
Stick Diagrams (2/3)
  • Key idea "Stick figure cartoon" of a layout
  • Useful for planning layout
  • relative placement of transistors
  • assignment of signals to layers
  • connections between cells
  • cell hierarchy

41
Stick Diagrams (3/3)
42
Example - Stick Diagrams (1/2)
Alternatives - Pull-up Network
Circuit Diagram.
Pull-Down Network (The easy part!)
Complete Stick Diagram
43
Example - Stick Diagrams (2/2)
44
Dynamic latch stick diagram
VDD
in
out
VSS
phi
phi
45
Stick Diagram XOR Gate Examples
46
Hierarchical Stick Diagrams
  • Define cells by outlines use in a hierarchy to
    build more complex cells

47
Cell Connection Schemes
  • External connection - wire cells together
  • Abutment - design cells to connect when adjacent
  • Reflection, mirroring - use to make abutment
    possible

48
Example 2-input multiplexer
  • First cut

49
Sticks design of multiplexer
  • Start with NAND gate

50
NAND sticks
VDD
a
out
b
VSS
51
Refined one-bit Mux Design
  • Use NAND cell as black box
  • Arrange easy power connections
  • Vertical connections for allow multiple bits

52
3-bit mux sticks
select
select
m2(one-bit-mux)
select
select
VDD
ai
oi
a2
o2
VSS
bi
b2
m2(one-bit-mux)
select
select
VDD
ai
a1
oi
o1
VSS
bi
b1
m2(one-bit-mux)
select
select
VDD
ai
a0
oi
o0
VSS
bi
b0
53
Multiple-Bit Mux
54
Cell Mirroring, Overlap
  • Use mirroring, overlap to save area

55
Example Layout / Stick Diagram
  • Create a layout for a NAND gate given
    constraints
  • Use minimum-size transistors
  • Assume power supply lines pass through cell
    from left to right at top and bottom of cell
  • Assume inputs are on left side of cell
  • Assume output is on right side of cell
  • Optimize cell to minimize width
  • Optimize cell to minimize overall area

56
Layout Example
Exterior of Cell
Circuit Diagram.
57
Example - Magic Layout
  • Overall Layout 52 X 16

58
Review - VLSI Levels of Abstraction
59
Levels of Abstraction - Perspective
  • Right now, were focusing on the low level
  • Circuit level - transistors, wires, parasitics
  • Layout level - mask objects
  • Well work upward to higher levels
  • Logic level - individual gates, latches,
    flip-flops
  • Register- transfer level - Verilog HDL
  • Behavior level - Specifications

60
The Challenge of Design
  • Start higher level (spec)
  • Finish lower level (implementation)
  • Must meet design criteria and constraints
  • Design time - how long did it take to ship a
    product?
  • Performance - how fast is the clock?
  • Cost - NRE unit cost
  • CAD tools - essential in modern design

61
CAD Tool Survey Layout Design
  • Layout Editors
  • Design Rule Checkers (DRC)
  • Circuit Extractors
  • Layout vs. Schematic (LVS) Comparators
  • Automatic Layout Tools
  • Layout Generators
  • ASIC Place/Route for Standard Cells, Gate Arrays

62
Layout Editors
  • Goal produce mask patterns for fabrication
  • Grid type
  • Absolute grid (MAX, LASI, LEdit, Mentor
    ICStation, other commercial tools)
  • Magic lambda-based grid - easier to learn, but
    less powerful
  • Mask description
  • Absolute mask (one layer for each mask)
  • Magic symbolic masks (layers combine to generate
    actual mask patterns)

63
Design Rule Checkers
  • Goal identify design rule violations
  • Often a separate tool (built in to Magic)
  • General approach scanline algorithm
  • Computationally intensive, especially for large
    chips

64
Circuit Extractors
  • Goal extract netlist of equivalent circuit
  • Identify active components
  • Identify parasitic components
  • Capacitors
  • Resistors

65
Layout Versus Schematic (LVS)
  • Goal Compare layout, schematic netlists
  • Compare transistors, connections (ignore
    parasitics)
  • Issue error if two netlists are not equivalent
  • Important for large designs

66
Automatic Layout Tools
  • Layout Generators - produce cell from spec.
  • Simple Procedural specification of layout
  • (see book Fig. 2-33, p. 95)
  • Complex Netlist - places wires individual
    transistors
  • ASIC - Place, route modules with fixed shape
  • Standard Cells - use predefined cells as "cookie
    cutters"
  • Gate Arrays - configurable pre-manufactured gates
    (only change metal masks)
  • FPGAs - electrically configurable array of gates

67
Layout design and analysis tools
  • Layout editors are interactive tools.
  • Design rule checkers are generally
    batch---identify DRC errors on the layout.
  • Circuit extractors extract the netlist from the
    layout.
  • Connectivity verification systems (CVS) compare
    extracted and original netlists.

68
Automatic layout
  • Cell generators (macrocell generators) create
    optimized layouts for ALUs, etc.
  • Standard cell/sea-of-gates layout creates layout
    from predesigned cells custom routing.
  • Sea-of-gates allows routing over the cell.

69
Standard cell layout
routing area
routing area
routing area
routing area
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