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SURFOX: Research in IMS

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Characterization of microstructures of Cu, Cu-alloys, Fe, Fe-Cr-alloys and Zn ... X-ray diffractometer: Siemens D500. Simultaneous thermal analyzer: Netsch DTA 490 ... – PowerPoint PPT presentation

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Title: SURFOX: Research in IMS


1
SURFOX Research in IMS
  • Research resources in IMS
  • Leader Prof. Toivo Lepistö
  • Research Dr. Minnamari Vippola and M.Sc. Mari
    Honkanen
  • Support Lic.Tech. Jaakko Keränen, M.Sc. Jussi
    Laurila and Dr. Jyrki Vuorinen
  • Research objectives in IMS
  • Characterization of microstructures of Cu,
    Cu-alloys, Fe, Fe-Cr-alloys and Zn-based
    metallized thin films and their oxide structures
    and interface reactions between the metal and
    metal oxides in order to verify the structural
    features, phases and chemical composition and
    their effect on oxidation phenomenon.
  • Oxidation kinetics studies of metal alloys and
    metallized thin films with thermogravimetry and
    differential scanning calorimetry measurements in
    order to study the oxidation properties as a
    function of temperature and environment.

Dislocation structure in annealed Cu
Fatigued Cu single crystal
2
SURFOX Instruments in IMS
  • Available instruments in IMS
  • Equipment for precise sample preparation
  • Optical microscopy
  • Scanning electron microscopes Philips XL30 with
    Edax DX-4 energy dispersive spectrometer (EDS)
    and electron back-scattering diffraction (EBSD)
    facility , Philips SEM 515 with Tracor EDS and
    Jeol JSM-T100
  • Analytical transmission electron microscope
    Jeol JEM 2010 with Noran Vantage EDS and Gatan
    Model 666 parallel electron energy loss
    spectrometer
  • X-ray diffractometer Siemens D500
  • Simultaneous thermal analyzer Netsch DTA 490
  • Differential Scanning Calorimeter DSC, Perkin
    Elmer

TG- oxidation curve for Cu
Netzsch STA 409
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