Status of the electronic systems of the MEG Experiment - PowerPoint PPT Presentation

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Status of the electronic systems of the MEG Experiment

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Microcontroller crashes if HV load changes quickly. Redesign ... Algor. Circ. buff. Circ. buff. Circ. buff. Circ. buff. 16 PMT. 16 PMT. input. input. output ... – PowerPoint PPT presentation

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Title: Status of the electronic systems of the MEG Experiment


1
Status of the electronic systems of the MEG
Experiment
2
Topics
  • HV
  • Splitter
  • Trigger
  • Domino Ring Sampler

3
HV
  • Original design works - 0.2V _at_ 2400V
  • Microcontroller crashes if HV load changes
    quickly
  • Redesign started in Nov. 03
  • Improved sensitivity 16-bit DACs, 24-bit ADCs
  • (linear LTC2600 , analog device AD7718)
  • Faster microcontroller for 4 channels
  • (silabs C8051F310)
  • HV part optically decoupled from microcontroller
  • Communication always through the MSCB
  • Prototype in March 04

4
Splitters
  • Milestones
  • End of sep 2003 2-channels card built.
  • End of oct 2003 4-channels card prototype built.
  • Half of nov 2003 4 x 4-channels cards with
    minicrate and power supply built and tested at
    PSI.
  • End of nov 2003 test at PSI.

5
Splitter in/out
  • 4 splitter boards with
  • 4 inputs 50 O impedance (PMT input)
  • 4 x 2 outputs single-ended large bandwidth (DRS
    board and Monitor)
  • 4 outputs differential reduced-bandwidth
    (Trigger)
  • 1 adder sum of the 4 inputs (Trigger)

in
adder
6
Splitter Electrical Characteristics
  • Based on Analog Device IC AD8009 and AD8138
  • Gain of x1 (modified to x10 at PSI)
  • Integral non-linearity lt6 (5.5 typical),
  • between 40 and 130 mV input signal
  • Channel to channel crosstalk lt0.2 (0.1
    typical) between 40 and 200 mV input signal
  • Rise time lt1.5ns (1.2ns typical)
  • Gain10

7
Timing comparison (channel F9)
TDC (ns)
Photoelectrons
Photoelectrons
TDC (ns)
TDC (ns)
8
Timing comparison (channel F11)
TDC (ns)
Photoelectrons
Photoelectrons
TDC (ns)
TDC (ns)
9
Next steps
  • Adding single channel kill control
  • Adding test input
  • Increasing card density using CRG 0603 size
    components

10
Expected Trigger Rate
  • Accidental background and
  • Rejection obtained by applying cuts on the
    following variables
  • photon energy
  • photon direction
  • hit on the positron counter
  • time correlation
  • positron-photon direction match

The rate depends on R? Re ? R?2
11
The trigger implementation
  • Digital approach
  • Flash analog-to-digital converters (FADC)
  • Field programmable gate array (FPGA)
  • Final system
  • Only 2 different board types
  • Arranged in a tree structure on 3 layers
  • Connected with fast LVDS buses
  • Remote configuration/debugging capability
  • Prototype board
  • Check of
  • the FADC-FPGA compatibility
  • chosen algorithms
  • synchronous operation
  • data transmission

12
Trigger prototype board Type 0
  • VME 6U
  • A-to-D Conversion
  • Trigger
  • I/O
  • 16 PMT signals
  • 2 LVDS transmitters
  • 4 in/2 out control signals
  • Complete system test

Board Type0
13
The boardType0
control signals.
LVDS transm.
Differential drivers
PMT inputs
FPGA
FADC
LVDS receiv.
configuration EPROMS
package error solved with a patch board
14
Prototype system
Two identical Type0 boards
Board 0
Board 1
Ancillary board Clock, sync, trigger and start
distribution
LVDS connection
15
Prototype system configuration
Board 1
input
output
16 PMT
Board 0
16 PMT
input
output
LVDS in
final
16
Prototype system tests
  • Debugging of the first board Type0 in Pisa
  • A minor error fixed
  • System assembled at PSI in Nov. 03
  • 100MHz synchronous operation
  • Negligible transmission error rate
  • Satisfactory operation of the analog interface
  • Connection with the Large Prototype
  • PMT from 0 to 31
  • Collected data
  • Alpha
  • Led
  • ?0

17
Alpha
Amplitude mV
Input cyclic-buffer board 1
Time 10 ns
18
LED
Amplitude mV
Time 10 ns
19
?0
Amplitude mV
Time 10 ns
20
Internal trigger
Pulse time
Output cyclic-buffer board 0
Input cyclic-buffer board 0
Amplitude mV
Amplitude sum
Index of Max
Max. Amplitude (?2)
Time 10 ns
21
LVDS transmission
Pulse time
Amplitude mV
Output cyclic-buffer board 1
LVDS input cyclic-buffer board 0
Amplitude sum
Index of Max
Max. Amplitude (?2)
Time 10 ns
7 clock cycles delay
22
Example of data comparison
  • ?0 data
  • Charge spectrum
  • Only 32 PMT

23
Further works
  • Hardware
  • JTAG programming/debugging through VME by
    modifying the Type0
  • Block transfer in A32D16 format (VME library to
    be modified)
  • Final characterization on linearity, cross talk
  • Analysis
  • Alpha, Led and ?0 data to extensively check the
    algorithms

Conclusions
The prototype system met all requirements It is
available to trigger the LP in future beam tests
24
Final system
  • Trigger location platform
  • Spy buffers to check the data flow are
    implemented
  • JTAG programming/debugging through VME test
    planned with Type0
  • Final boards
  • VirtexII or Spartan3 ?
  • Main FPGA XCV812E-8-FG900 is old, first
    production in 2000
  • Connectors
  • Analog input by 3M coaxial connectors
  • LVDS connection by 3M cables
  • Differential driver on the trigger board Type1
  • Other components are fixed FADC, LVDS Tx and Rx,
    Clock distributor
  • Ancillary boards distribution of control signals
  • Design of final prototypes (Type1 and Type2) june
    2004
  • If tests are ok ? start of the mass
    production
  • Estimated production and test 1 year

25
Trigger
Jan 2002
2002
2003
2004
2005
Prototype Board
Final Prototype
Full System
now
Test
Milestone
Assembly
Design
Manufactoring
26
DRS2 Chip
  • DRS2 chip designed
  • 500 MHz 5 GHz sampling speed
  • 82 channels, 1024 bins deep each
  • Readout speed up to 100 MHz (?)
  • Production
  • Submitted to UMC in Nov. 18th
  • 58 chips received in Jan. 15th
  • packaging 3 weeks
  • Tests planned Feb. 04 April 04
  • Redesign only if problems
  • (next submission April or June 04)
  • Board integration July 04 (PSI GVME board)
  • Full chip production run in fall 04

27
DRS2 Chip Layout
Domino Circuit
Readout shift register
Die 5 x 5 mm 250,000 Transistors Chip PLCC
68
2 Test channels
10 channels x 1024 bins
28
PSI - Generic VME PMC carrier board
29
PMC carrier board
DRS 1st Prototype
  • Joint effort with the MAGIC experiment (Uni. of
    Siena and INFN Pisa)
  • Clock control (locking to external source)
  • DRS readout with FADC
  • DRS control signals

30
DRS (DAQ)
2002
2003
2004
2005
Tests
1st Prototype
2nd Prototype
Boards Chip
Test
now
Test
Milestone
Assembly
Design
Manufactoring
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