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The Determination of Molecular Structure by Diffraction Method

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Optical microscopy - resolution restricted by Wavelength (l) ... The white radiation intensity curve may be fit to an expression of the form: ... – PowerPoint PPT presentation

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Title: The Determination of Molecular Structure by Diffraction Method


1
The Determination of MolecularStructure by
Diffraction Method
  • 93/2Advanced Inorganic Chemistryby HML, NCUE

2
X-ray
  • Optical microscopy - resolution restricted by
    Wavelength (l)
  • Smaller l required for greater resolution
  • For resolution at atomic level need l 10-10 m (1
    Å)
  • X-rays discovered in 1895 (Roentgen)

3
Electromagnetic Spectrum
4
Sealed X-ray tube
5
X-ray production
Collision with weakly-bound electrons slows
electron beam and produces x rays.
6
Heat generation
  • Only about 0.1 of the electrical energy input is
    converted to X-rays. The rest is dissipated as
    heat. A constant supply of cooling water is
    circulated through the X-ray tube to keep it from
    melting. (The x-ray machine is a very inefficient
    apparatus.)
  • The accelerated electrons interact with the
    valence electrons of the target atoms but do not
    transfer sufficient energy to these outer-shell
    electrons to ionize them. The outer-shell
    electrons are simply raised to an excited, or
    higher, energy level. The outer-shell electrons
    immediately drop back to their normal energy
    state with the emission of infrared radiation.
    The constant excitation and re-stabilization of
    outer-shell electrons generates heat in the
    anodes of x-ray tubes.

7
White radiation
  • Bremsstrahlung (braking) continuous spectrum of
    X-ray
  • X-rays are generated by the acceleration of
    electrons by an electric field towards a metal
    target.
  • The collisions of the accelerated electrons with
    the nuclei of the target atoms give rise to white
    radiation. The kinetic energy of the accelerated
    electron is partially converted into
    electromagnetic energy.

8
A graph of the l of the X-rays emitted against
their intensity for varying applied accelerating
voltages
9
  • The distribution of the radiation is similar to
    the Boltzman distribution. This is a function of
    the potential and has little to do with the
    target material
  • A sharp cut-off at short wavelength. This minimum
    wavelength, lmin, corresponds to the maximum
    efficiency of conversion of the kinetic energy to
    electromagnetic radiation.

10
lmin
  • Emax h?max eV
  • where h Plank's constant, ?max the largest
    frequency, e charge of an electron, V applied
    voltage. This maximum energy or minimum
    wavelength is called the Duane-Hunt limit.
  • h?max hc/?min eV
  • ?min hc / eV 12398 / V (volts)

11
The intensity of the white radiation
  • The highest intensity of emitted white radiation
    spectrum is obtained at a wavelength that is
    about 1.5 time lmin. The white radiation
    intensity curve may be fit to an expression of
    the form
  • Iw A i Z Vn, n 2
  • where i is the applied current, Z is the atomic
    number of the target, V is the applied voltage
    and A is a proportionality constant.

12
Characteristic x-rays produced by photo-electric
absorption of tightly-bound electrons
K-shell electron ejected
L shell
K shell
L electron fills K shell
Characteristic X Ray
13
Electronic energy levels of an atom of the anode
  • Ka radiation
  • L ? K
  • (2s ? 1s) Ka1
  • (2p ? 1s) Ka2
  • Kb radiation
  • M ? K

14
Typical x-ray spectrum
15
Characteristic radiation
  • The Ka1 line is about twice as intense as the Ka2
    line. At low resolution (low scattering angle)
    the Ka wavelength is considered as a weighted
    average of the Ka1 and Ka2 lines with ?(Kaave)
    2(?(Ka1)) ?(Ka2)/3. The Ka line is about 5 -
    10 times as intense as the Kß line.
  • The intensity of the Ka line can be approximately
    calculated by
  • Ik B i (V - Vk)1.5
  • where i applied current, Vk excitation
    potential of the target material, V applied
    voltage.
  • The ratio Ik / Iw is a maximum if the
    accelerating voltage is chosen to be about 4
    times the excitation potential of the anode.

16
Selected X-ray Wavelengths and Excitation
Potentials.
17
Choice of radiation
  • Ka lines highest intensity, used for standard
    X-ray diffraction
  • Two metal targets are frequently used (Cu Ka ?
    1.5 Å and Mo Ka ? 0.7 Å).
  • Copper radiation used for macromolecular
    structures of large unit cell and organic
    molecules. Diffracted beams are more separated on
    a detector if a longer wavelength is used.
    Organic molecules do not absorb strongly the Cu
    radiation. Mo radiation with small wavelength
    gives higher resolution data inaccessible to Cu
    radiation.
  • Choice of radiation also depends on detector
    used. Films are better for Cu than Mo.
    Diffractometer counters have a very high counting
    efficiency with Mo radiation.

18
Cu vs. Mo
  • Copper radiation is preferred when the crystals
    are small or when the unit cells are large.
    Copper radiation (or softer) is required when the
    absolute configuration of a compound is needed
    and the compound only contains atoms with atomic
    numbers lt 10. A copper source is preferred for
    most types of powder diffraction.
  • Molybdenum radiation is preferred for larger
    crystals of strongly absorbing materials and for
    very high resolution, sin (?) / ? lt 0.6 Å, data.

19
Focal spot geometry
20
Rotating anode X-ray generator
  • Sealed-tube X-ray generators are inefficient in
    producing X-rays.
  • The power is limited by the amount of heat that
    can be dissipated by water cooling.
  • One way to increase the heat dissipating ability
    of the system, and thus increase the X-ray beam
    intensity, is to move or rotate the anode surface
    so that the beam of electrons continually hits a
    new region of the anode. These rotating-anode
    generators typically yield about 5 times the flux
    of X-rays as is routinely produced by sealed-tube
    generators with normal-focus X-ray tubes.
  • Rotating anode protein
  • Sealed X-ray tube small molecule

21
X-ray absorption
  • X-rays can be absorbed by solids
  • The absorption of X rays follows Beer's Law
  • I / Io exp(-µ t)
  • where I transmitted intensity, Io incident
    intensity, t thickness of material, µ linear
    absorption coefficient of the material.

22
A plot of m against l
  • A smooth curve in this plot is followed by very
    sharp jumps. These discontinuities are called
    absorption edges and they occur at the wavelength
    corresponding to the energy needed to knock an
    electron out of an atomic orbital in the material
    that is doing the absorbing.

23
K absorption edge
  • the K absorption edge of an element lies very
    slightly to the short wavelength side of the K
    beta lines for that element.
  • Like the characteristic lines, the absorption
    edge shifts to longer wavelength with decrease in
    atomic number.

24
Filters
  • If another substance can be found that has an
    absorption edge between the Ka and Kß lines of
    the incident photon beam, this other substance
    can be used to significantly reduce the intensity
    of the Kß line relative to the Ka line. The
    absorption edges of elements with ZFilter
    ZTarget - 1 (or - 2) meet this requirement.

25
Monochromators
  • To diffract the incident beam from a single
    crystal of known lattice dimensions.
  • X-Ray photons of different wavelengths are
    diffracted from a given set of planes in a
    crystal at different scattering angles according
    to Bragg's Law.
  • A narrow band of wavelengths can be chosen by
    selecting a particular scattering angle for the
    monochromatic crystal.
  • Mostly used graphite(0002) face germanium,
    lithium fluoride crystals.

26
Diffraction of light
27
Wave interferences
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29
Braggs Law
30
Braggs law
  • Crystal is treated as planes (or layers) which is
    semi transparent to X-rays.

xy yz d sin q Thus, xyz 2d sin q But for
constructive interference to occur xyz
nl Therefore 2d sin q nl Braggs
Law Variation of 0.1 enough for complete
destructive interference.
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38
Instrument setup
39
X-ray diffractometers
40
Siemens Diffractometer (1995)
41
Bruker Diffractometer (1999)
42
Parts of the Instruments
  • CCD detector
  • X-ray generator
  • N2cryostat
  • Goniometer head
  • Goniostat
  • Video-microscope
  • X-ray tube
  • X-ray optics
  • Computer

43
CCD Detectors
  • CCD stands for charge-coupled device
  • Diffracted X-rays from sample strike a phosphor
  • Fiber-optic cables route light to a specific
    pixel on CCD chip
  • 1024 x 1024 pixels are active and binned 512 x
    512

44
X-Ray Generators
  • Generator power is set in KV and mA
  • Operation at 40KV / 50 mA

45
N2 Cryostats
  • Siemens has a LT-2 cryostat 173 K min.
  • Bruker has a Oxford Cryostream 600 series
    cryostat 80 K min.
  • Both cryostats feed liquid nitrogen into the
    device and provide a stable temperature for data
    collection

46
Goniometer head
  • Goniometer heads have x and y adjustments at the
    base and z at top.
  • The specimen is placed at a location known as
    thesphere of confusion
  • Collimator to right
  • Beam stop to left

47
Goniostats
  • The goniostat has three independent axes
  • The Phi and Omega axes position the specimen
  • The 2-Theta axis places the CCD detector at the
    position required for data collection

48
Video-telescope
  • The video-telescope allows us to position the
    specimen
  • It also allows us to monitor phase transitions
    this sample undergoes a spin transition at 204
    where a deep purple color is observed

49
X-Ray tube
Anode Mo target
  • These X-ray tube have Mo targets.
  • Monochromator selects 0.71073 Å
  • Collimator provides 0.5 mm diameter beam at
    sphere of confusion
  • Use of X-ray sources requires special training.

50
Crystal centering
With silicon grease
glass capillary
51
Computer
52
Specimen Mounting
53
Air-Sensitive Sample Mounting
54
Low-Temperature Specimen Mounting
55
Data Collection
  • Standard sets of frames are collected most
    usually to cover a complete hemisphereto desired
    resolution

56
Data Reduction
  • Reflections from frames must be integrated with
    the SAINT program.
  • The geometric polarization and Lorentz
    corrections are applied.
  • An absorption correction is made with the SADABS
    program.
  • The program SHELXL-XPREP is used to determine the
    space group and to create files for structure
    solution.
  • SHELXL-XS provides complete structure solution
    with direct methods or a partial solution using
    the Patterson method.

57
XP Structure Evaluation
  • XP drawing of XS structure solution
  • All non-hydrogen atoms are present along with a
    few false peaks
  • Remove false peaks

58
XP Retaining Real Atoms
  • Sucrose has the formula C12H22O11
  • Once the non-hydrogen atoms are properly placed,
    then these parameters are refined with
    least-squares.
  • Hydrogen atoms are either placed geometrically
    or, if data is acceptable, located in difference
    Fourier map

59
XP Thermal Ellipsoid Drawings
  • One of the final things to do with a structure is
    to create the art work
  • Thermal ellipsoid drawing as seen in XP

60
XP Unit Cell Drawing
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