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Runtime Optimized Double Correlated Discrete Probability Propagation for Process Variation Character

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Title: Runtime Optimized Double Correlated Discrete Probability Propagation for Process Variation Character


1
Run-time Optimized Double Correlated Discrete
Probability Propagation for Process Variation
Characterization of NEMS Cantilevers
  • Rasit Onur Topaloglu PhD student
    rtopalog_at_cse.ucsd.eduUniv
    ersity of California, San DiegoComputer Science
    and Engineering Department 9500
    Gilman Dr., La Jolla, CA, 92093

2
Motivation
  • Cantilevers are fundamental structures used
    extensively in novel applications such as atomic
    force microscopy or molecular diagnostics, all of
    which require utmost precision
  • Such aggressive applications require
    nano-cantilevers
  • Manufacturing steps for nano-structures bring a
    burden to uniformity between cantilevers designed
    alike
  • These process variations should be able to be
    estimated to account for and correct for the
    proper working of the application

3
Applications - Atomic Force Microscopy
  • IBMs Millipede technology requires a matched
    array of 6464 cantilevers
  • Aggressive bits/inch targets drive cantilever
    sizes to nano-scales
  • Process variations might incur noise to
    measurements hence degrade SNR of the disk
  • Correct estimation will enable a safe choice of
    device dimension optimization

4
Single Molecule Spectroscopy
  • Cantilever deflection should be utmost accurate
    to measure the molecule mass

5
Simulating MEMS Linear Beam Model in Sugar
  • Each node has 3 degrees of freedom
  • v(x) transverse deflection
  • u(x) axial deflection
  • ?(x) angle of rotation
  • Between the nodes, equilibrium equation
  • Its solution is cubic
  • Boundary conditions at ends yield
    four equations and four
    unknowns

6
Acquisition of Stifness Matrix
  • Solving for x between nodes
  • where H are Hermitian shape functions
  • Following the analysis, one can find stiffness
    matrix using Castiglianos Theorem as

7
Acquisition of Mass and Damping Matrices
  • Equating internal and external work and using
    Coutte flow model, mass and damping matrices
    found
  • Hence familiar dynamics equation found
  • where displacements are
    and
  • the force vector is
  • W, L , H can be identified as most influential

8
Basic Sugar Input and Output
  • mfanchor _n("substrate") material p1, l
    10u, w 10u
  • mfbeam3d _n("substrate"), _n("tip") material
    p1, l a, w b, h c
  • mff3d _n("tip") F 2u, oz (pi)/(2)
  • l100 wh2
    l110 wh2
  • dy3.0333e-6
    dy 4.0333e-6

9
Monte Carlo Approach in Process Estimation
W
L
h
dy
  • Pick a set of numbers according to the
    distributions and simulate this is one MC run
  • Repeat the previous step for 10000 times
  • Bin the results to get final distribution

10
FDPP Approach
W
L
h
dy
  • Discretize the distributions
  • Take all combinations of samples each run gives
    a result with a probability that is a multiple of
    individual samples
  • Re-bin the acquired samples to get the final
    distribution
  • Interpolate the samples for a continuous
    distribution

11
Probability Discretization Theory
Discretization Operation
pdf(X)
pdf(X)
X
spdf(X)?(X)
spdf(X)
wi value of ith impulse
X
  • QN band-pass filter pdf(X) and divide into bins
  • Use Ngt(2/m), where m is maximum derivative of
    pdf(X), thereby obeying a bound similar to Nyquist

N in QN indicates number or bins
12
Propagation Operation
  • F operator implements a function over spdfs
    using deterministic sampling

Xi, Y random variables
  • Heights of impulses multiplied and probabilities
    normalized to 1 at the end

pXs probabilities of the set of all samples s
belonging to X
13
Re-bin Operation
Resulting spdf(X)
Unite into one ? bin
Impulses after F
  • Samples falling into the same bin congregated in
    one
  • Without R, Q-1 would result in a noisy graph
    which is not a pdf as samples would not be
    equally separated

where
14
Correlation Modeling
  • Width and length depend on the same mask, hence
    they are assumed to be highly correlated ?0.9
  • Height depends on the release step, hence is
    weakly correlated to width and length ?0.1

15
Double Correlated FDPP Approach
W
L
h
dy
  • Instead of using all samples exhaustively, since
    samples are correlated, create other samples
    using the sample of one parameter (e.g.W as
    reference)
  • ex. L_sa W_sb Randn() where
    ?a/sqrt(a2b2)
  • Do this twice, one for () one for (-)
    correlation so that the randomness in the system
    is also accounted for towards both sides of the
    initial value hence double-correlated

16
Monte Carlo Results
MC 100 pts
MC 1000 pts
MC 10000 pts
?3.0409-6
?3.0407e-6
?3.0352e-6
  • For MC, probability density function is too noisy
    until high number of samples, which require high
    run-times, used

17
Monte Carlo -DC FDPP Comparison
DC-FDPP
Compared with MC 10000 pts
??0.425 ?max1.88 ?min3.67
?3.0481e-6 max3.5993e-6 min2.61e-6
  • Same number of finals bins and same correlated
    sampling scheme used for a fair comparison
  • Comparable accuracy achieved using 500 times less
    run-time

18
Conclusions
  • Monte Carlo methods are time consuming
  • A computational method presented for 500 times
    faster speed with reasonable accuracy trade-off
  • The method has been successfully integrated into
    the Sugar framework using Matlab and Perl scripts
  • Such methods can be used while designing and
    optimizing nano-scale cantilevers and
    characterizing process variations amongst matched
    cantilevers

19
References
  • Cantilever-Based Biosensors in CMOS Technology,
    K.-U. Kirstein et al. DATE 2005
  • High Sensitive Piezoresistive Cantilever Design
    and Optimization for Analyte-Receptor Binding, M.
    Yang, X. Zhang, K. Vafai and C. S. Ozkan, Journal
    of Micromechanics and Microengineering, 2003
  • MEMS Simulation using Sugar v0.5, J. V. Clark, N.
    Zhou and K. S. J. Pister, in Proceedings of
    Solid-State Sensors and Actuators Workshop, 1998
  • Forward Discrete Probability Propagation for
    Device Performance Characterization under Process
    Variations, R. O. Topaloglu and A. Orailoglu,
    ASPDAC, 2005
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