2019 Global Thin Film Metrology Systems Market Forecast & Analysis

1
Global Thin Film Metrology Systems Market
2015-2019
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• Published January 2015
• Single User PDF US 2500
• Corporate User PDF US 4000

2
Global Thin Film Metrology Systems Market
2015-2019

• Thin film metrology systems are used to measure
  the film thickness accurately. A series of film
  layers that act as a conductors, semiconductors,
  or bare wafers are deposited on an IC during IC
  fabrication. Thin film metrology systems are
  required during thin film deposition process to
  monitor and measure thin film parameters such as
  thickness, resistivity, and stress. There are
  various technologies used to measure the film
  thickness which include profilometry,
  ellipsometry, spectroscopic reflectrometry, and
  X-ray analysis.
• Analysts forecast the Global Thin-film Metrology
  Systems market will grow at a CAGR of 3.4 percent
  over the period 2014-2019.
• Covered in this Report
• This report covers the present scenario and
  growth prospects of the Global Thin Film
  Metrology Systems market for the period
  2015-2019. It considers 2014 as the base year and
  provides data for the trailing 12 months. To
  calculate the market size, the report considers
  revenue generated from the sales of thin film
  metrology systems to various end-users including
• ODMs
• OEMs
• Foundries

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3
Global Thin Film Metrology Systems Market
2015-2019

• Key Regions
• Americas
• APAC
• EMEA
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• Key Vendors
• KLA-Tencor
• Nanometrics
• Nova Measuring Instruments
• Rudolph Technologies
•  
• Other Prominent Vendors
• Hitachi High-Technologies
• SCREEN Holdings
• Semilab

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Global Thin Film Metrology Systems Market
2015-2019

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• Key Market Driver
• Increased Level of Complexity in Ics
• Key Market Challenge
• Cyclic Nature of Semiconductor Industry
• Key Market Trend
• Increasing Demand for Integration and
  Miniaturization of Semiconductor Devices
• Key Questions Answered in this Report
• What will the market size be in 2019 and what
  will the growth rate be?
• What are the key market trends?
• What is driving this market?
• What are the challenges to market growth?
• Who are the key vendors in this market space?
• What are the market opportunities and threats
  faced by the key vendors?
• What are the strengths and weaknesses of the key
  vendors?

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Global Thin Film Metrology Systems Market
2015-2019

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• List of Exhibits
• Exhibit 1 Market Research MethodologyExhibit 2
  Semiconductor Value ChainExhibit 3 Global Thin
  Film Metrology Systems Market (US
  million)Exhibit 4 Global Thin Film Metrology
  Systems Market by Geography 2014-2019 (CAGR) 
• Exhibit 5 Global Thin Film Metrology Systems
  Market by Geography 2014-2019Exhibit 6 Global
  Thin Film Metrology Systems Market by Geography
  2014-2019 (US million)Exhibit 7 Global Thin
  Film Metrology Systems Market by Vendor
  Segmentation 2014Exhibit 8 KLA-Tencor Product
  SegmentationExhibit 9 KLA-Tencor Services
  OfferedExhibit 10 KLA-Tencor Geographical
  Segmentation by Revenue 2014Exhibit 11
  Nanometrics Business Segmentation by Revenue
  2013Exhibit 12 Nanometrics Business
  Segmentation by Revenue 2012 and 2013 (US
  billion)Exhibit 13 Nanometrics Geographical
  Segmentation by Revenue 2013Exhibit 14 Nova
  Measuring Instruments Product Segmentation
  2013Exhibit 15 Nova Measuring Instruments
  Geographical Segmentation by Revenue 2013Exhibit
  16 Rudolph Technologies Business Segmentation
  by Revenue 2013Exhibit 17 Rudolph Technologies
  Business Segmentation by Revenue 2012 and
  2013(US million)Exhibit 18 Rudolph
  Technologies Geographical Segmentation by
  Revenue 2013

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Global Thin Film Metrology Systems Market
2015-2019

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