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Ultra Low Power CMOS Design

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Ultra Low Power CMOS Design Ph.D. Dissertation Proposal Kyungseok Kim ECE Auburn Univ. Chair: Prof. Vishwani D. Agrawal Committee Members: Prof. Victor P. Nelson – PowerPoint PPT presentation

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Title: Ultra Low Power CMOS Design


1
Ultra Low Power CMOS Design
  • Ph.D. Dissertation Proposal
  • Kyungseok Kim
  • ECE Auburn Univ.

Chair Prof. Vishwani D. Agrawal
Committee Members Prof. Victor P. Nelson Prof.
Fa F. Dai
May 11, 2010
2
Outline
  • Study of Subthreshold Voltage Operation
  • Dual Voltage Assignment Algorithm (MILP)
  • Current Progress Future Work
  • Conclusion

3
Energy Constrained Systems
  • Low activity rates
  • Relaxed speed requirements
  • Long battery lifetimes ( more than 1 year )
  • Energy harvesting from the environment
  • Examples
  • Micro-sensor networks, Pacemakers, RFID
    tags, and Portable devices

Energy Harvesting Tech. Power Density ( µW/cm2 )
Vibration - electromagnetic Vibration - piezoelectric Vibration - electrostatic Thermoelectric ( 5C difference) Solar - direct sunlight Solar - indoor 4.0 500 3.8 60 3700 3.2
A. Wang, B. H. Calhoun, and A. P. Chandrakasan,
Sub-Threshold Design for Ultra Low-Power Systems.
Springer, 2006.
4
Subthreshold Operation (weak inversion)
Eric A. Vittoz (1967) discovered that the
transfer characteristics of MOS device were
exponential across more than 5 decades of drain
current.
Measurement of a MOS transistor at very low
current (Vittozs notebook)
E. A. Vittoz, The Electronic Watch and Low-Power
Circuits, IEEE Solid-State Circuits Newsletter,
vol. 13, no. 3, pp. 723, 2008.
5

Minimum Operating Voltage
  • Swanson and Meindl (1972) examined the voltage
    transfer characteristic (VTC) of an inverter
  • Minimum Voltage 8kT/q or 200 mV at
    300K
  • (A ring oscillator worked at 100 mV soon
    thereafter.)
  • Ideal limit of the lowest possible supply
    voltage (2001)
  • Vdd 2kT/q 57 mV at 300K

R. M. Swanson and J. D. Meindl, Ion-Implanted
Complementary MOS Transistors in Low-Voltage
Circuits, IEEE JSSC, vol. 7, no. 2, April
1972. A. Bryant, J. Brown, P. Cottrell, M.
Ketchen, J. Ellis-Monaghan, E. Nowak, I. Div, and
E. Junction, Low-power CMOS at Vdd 4kT/q, in
Device Research Conference, 2001, pp. 2223.
6
VTC of Inverter in PTM 90nm CMOS
SPICE simulation ( Predictive Technology Model,
PTM )
Vth_nmos 0.29 V, Vth_pmos 0.21 V Nominal
VDD 1.2 V, Temp. 300K Inverter size WP
5.5L Wn 2.4L L 90nm
7
180 mV FFT Processor
  • Dynamic Voltage Scaling (DVS) in subthreshold
    region according to operating scenarios
  • ( 128 to 1024 FFT length and 8 or 16 bit
    precision)
  • Tech. Standard 018 µm 6M CMOS (Vth 450 mV)
  • Voltage scaling 180 mV to 900 mV
  • Operating Freq. 164 Hz to 6 MHz
  • Optimal operating point for 1024 and 16b
  • Vdd,opt 350 mV Freq. 9.6 kHz
    Eopt 155 nJ
  • Above-threshold low power FFT processor
    consumes 3.4 µJ
  • in 0.7 µm process with 1.1 V

A. Wang and A. Chandrakasan, A 180mV FFT
Processor Using Subthreshold Circuit Techniques,
in IEEE International Solid-State Circuits
Conference Digest of Technical Papers, 2004, pp.
292529.
8
Minimum Energy Operating Point
  • Lowest energy per cycle
  • Eopt Minimum Etot Edyn Eleak
  • Dynamic energy Edyn
  • Leakage energy Eleak
  • Eopt normally occurs in subthreshold region if
    speed is not constrained
  • Speed critical operation
  • Vdd can be higher, even above-threshold

9
Vdd gt Vth
  • Dynamic Energy
  • Edyn a0?1CVdd2
  • Quadratic reduction with supply voltage Vdd
  • Activity factor a affects Edyn
  • Leakage Energy
  • Eleak Pleaktd IleakVddtd
  • Ileak is composed of subthreshod leakage, gate
    leakage and pn junction reverse-bias current ..
  • Normally smaller than dynamic energy

10
Vdd lt Vth
  • Dynamic Energy
  • Edyn scaled down as Vdd2 is comparable to Eleak
  • Leakage Energy
  • Assume Ileak Isub,off
  • td exponentially increases by scaling Vdd down
  • Eleak is independent of Vth

A. Wang, B. H. Calhoun, and A. P. Chandrakasan,
Sub-Threshold Design for Ultra Low-Power Systems.
Springer, 2006.
11
Ileak and td
Io Drain current at VgsVth S Subthreshold
swing ? Drain-induced barrier lowering ( DIBL
) VT Thermal voltage (kT/q)
Ileak Isub,off Isub (Vgs 0) DIBL reduces
Ileak with scaling Vdd
K Fitting parameter CL Load capacitance
Isub,on Isub (Vgs Vdd lt Vth)
12
Normalized Ileak and td for INV (SPICE
Simulation)
Eleak is mainly dominated by td in subthreshold
region.
13
Total Energy per Cycle ( Etot )
14
Threshold Voltage Vs. Total Energy
Lowering Vth does not change Eopt in the
subthreshold region
B.H. Calhoun, A. Wang, and A. Chandrakasan,
Modeling and Sizing for Minimum Energy Operation
in Subthreshold Circuits, in IEEE Journal of
Solid-State Circuits, Sept. 2005.
15
Energy Vs. Performance
Delay and energy per cycle of 8-bit ripple carry
adder ( SPICE Simulation )
  • Small increase of Etot in subthreshold region
    exponentially improves circuit speed

16
Outline
  • Study of Subthreshold Voltage Operation
  • Dual Voltage Assignment Algorithm (MILP)
  • Current Progress Future Work
  • Conclusion

17
Motivation
  • Utilizing time slack for low power design is
    common in above-threshold, but not has been done
    in subthreshold operation
  • Small increase in Etot can significantly
    improves circuit speed
  • Two supply voltages are acceptable in todays
    designs

18
Dual-Vdd Design
  • Use two supply voltages VDDH and VDDL
  • Apply VDDH to gates on critical paths to maintain
    performance (speed), while VDDL to gates on
    non-critical paths to reduce power
  • Use level converters at interfaces of VDDL cells
    feeding into VDDH cells

19
Driven Gates and Input Swing Level
20
Gate td and Pleak in Subthreshold
Simulation data (PTM 90nm CMOS) Two
supply voltages VDDH 250 mV and VDDL 200 mV
  • Level converter has unacceptable delay overhead
    for subthreshold circuits

Gate Above-threshold (VDDH1.2V, VDDL0.96V) Above-threshold (VDDH1.2V, VDDL0.96V) Sub-threshold (VDDH250mV, VDDL200mV) Sub-threshold (VDDH250mV, VDDL200mV)
Gate td (psec) Pleak (nW) td (nsec) Pleak (pW)
INV Level converter (LC) 9.54 68.13 6.87 31.30 0.83 254.21 46.2 214.6
LC norm. to INV 7.1 4.6 306.3 4.7
21
Algorithm I Eopt for Single Vdd
  • Characterize Standard cells for maximum delay,
    average leakage, and capacitances power using
    SPICE simulation over subthreshold region (100 mV
    to 300 mV, 10 mV step, 21 points, PTM 90 nm CMOS)
  • Low to high signal activity from logic simulator
  • Critical delay Tc from STA (21 points)
  • Calculate Etot by the sum of energy for gates
  • (21 points)
  • Find lowest Etot as Eopt

22
Algorithm I Results
16-bit ripple carry adder for single
Vdd
23
Algorithm II VDDL Assignment
  • VDDH and Tc are given as inputs from Algorithm I
  • Use repeatedly MILP to solve Etot and VDDL
    assignment to selected gates on the non-critical
    paths to achieve minimum energy for a pair of
    VDDH and VDDL ( Vmin90 mV VDDL lt VDDH )
  • Find Eopt and best VDDL Assignment corresponding
    to Eopt
  • Eliminate level converters in dual supply voltage
    operation by suitable constraints in MILP

24
MILP for VDDL Assignment
For given speed requirement Tc ( VDDH )

Xi Integer variable 0 for VDDH or 1 for VDDL
Ti is the latest arrival time at a gate i output
from PI events
T. Raja, V. D. Agrawal, and M. L. Bushnell,
Minimum Dynamic Power CMOS Circuit Design by a
Reduced Constraint Set Linear Program, in
Proceedings of 16th International Conference on
VLSI Design, Jan.2003, pp. 527532.
25
Topological Constraints
HH Xj 0 and Xi 0 ? Xi Xj 0 LL
Xj 1 and Xi 1 ? Xi Xj 0 HL Xj 0
and Xi 1 ? Xi Xj 1 LH Xj 1 and Xi
0 ? Xi Xj -1
Xi Xj 0
26
Example Result
16-bit Ripple-Carry Adder (a0.21) in 90nm Bulk CMOS 16-bit Ripple-Carry Adder (a0.21) in 90nm Bulk CMOS 16-bit Ripple-Carry Adder (a0.21) in 90nm Bulk CMOS 16-bit Ripple-Carry Adder (a0.21) in 90nm Bulk CMOS
Operation VDD (V) Energy/cycle (fJ) Clock rate
Nominal 1.2 252.2 1.35 GHz
Minimum Energy Single VDD 0.20 8.71 2.01 MHz
Dual VDD ( energy opt.) 0.19, 0.13 6.82 1.57 MHz
Dual VDD ( perf. opt.) 0.26, 0.18 8.55 8.12 MHz
27
Dual-Vdd Assignment Results
28
Outline
  • Study of Subthreshold Voltage Operation
  • Dual Voltage Assignment Algorithm (MILP)
  • Current Progress Future Work
  • Conclusion

29
Current Progress
  • Validation of a dual-Vdd technique in bulk CMOS
    subthreshold circuits
  • A method for finding minimum energy operating
    point in single supply voltage
  • An MILP for dual supply voltages in subthreshold
    region
  • Level converter are avoided
  • A paper submitted to ICCAD 2010

30
Future Work
  • Modify topological constraints to allow suitable
    level converters or to use circuit techniques,
    then possibly more VDDL cells
  • Build MILP framework for minimum energy optimized
    circuit using dual-Vdd and highest speed
  • Minimum energy operating circuit immune to
    functional fails and process variations

31
Outline
  • Study of Subthreshold Voltage Operation
  • Dual Voltage Assignment Algorithm (MILP)
  • Current Progress Future Work
  • Conclusion

32
Conclusion
  • Dual-Vdd MILP framework for minimum energy
    operating circuit design is effective from
    minimum energy operating point to highest speed
    operation
  • Ultra low power design without performance
    constraint
  • Minimum energy optimized design for given speed
  • Reduced energy optimization for highest speed

33
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