Title: MultiFrequency Wrapper Design and Optimization for Embedded Cores under Average Power Constraints
1Multi-Frequency Wrapper Design and Optimization
for Embedded Cores under Average Power
Constraints
Qiang Xu, Nicola Nicolici McMaster
University Krishnendu Chakrabarty Duke
University
2Outline
- Research Problem Overview
- Multi-Frequency Wrapper Design
- Multi-Frequency Wrapper Optimization
- Experimental Results
- Summary
3SOC with Multiple Clock Domains
4Scan Design with Multiple Clock Domains
5Clock Skew during Shift
- Having separate scan chains for each clock domain
- Using level-sensitive scan design (LSSD) scan
cells - Grouping flip-flops (FFs) from the same clock
domain and adding lockup- latches between
different clock domains
6Clock Skew during Capture
- Mask potential hazards using control and/or
observe points - Capture window design ATPG techniques
7Capture Window Design to Avoid Skew
- Combinational ATPG
- High test pattern count
Source http//www.mentor.com/dft/techpapers/
8Capture Window Design to Avoid Skew
- Sequential ATPG
- Low test pattern count
Source http//www.mentor.com/dft/techpapers/
9At-speed Testing
- Launch/Capture at rated-speed
- Scan shifting can be at slower frequency
- Helps to detect timing-related defects
10IEEE Std. 1500 Core Test Wrapper
Source Marinissen et al. ITC2000
11Multi-Frequency Wrapper Design
12Previous Scan Control Block Design
13New Scan Control Block Design
14Previous Timing Diagram
15New Timing Diagram
16Multi-Frequency Wrapper Optimization
- Problem Definition
- Given test set parameters
- Number of clock domains Nc
- Ni, No, Nbi, Nsc, SClength, Pi, Nv, for each
clock domain i - Average test power constraint Pave
- ATE shift frequency ft
- External TAM width Wext
- Determine the wrapper design
- Shift frequency fsi, VTB lines width Wi for each
clock domain i - Wrapper scan chain design
17Multi-Frequency Wrapper Optimization
- ILP Formulation
- Suppose the possible shift frequencies for each
VC are - which satisfy
- Classical min-max ILP formulation
- Complexity
- Number of Variables
- Number of Constraints
18Multi-Frequency Wrapper Optimization
- Fast Heuristic
- Initially assume all VTB lines shifting at FM
- Assign one VTB line to each virtual core
- Wrapper scan chain design for each
single-frequency VC - Repeat
- Assign one VTB line to the virtual core with the
maximum shifting time - Select the fs/NVTB that minimizes its overall
test cost, which considers both shifting time and
test power consumption
19Experimental Results Core Config.
20Experimental Results
21Experimental Results
22Summary
- Wrapper Design for Multi-Frequency Cores
- 1500-Compliant
- Avoid clock skew during test
- Allow different VCs operate at different
frequencies - Wrapper Optimization tradeoff
- Testing time
- Routing overhead
- Average power dissipation