MultiFrequency Wrapper Design and Optimization for Embedded Cores under Average Power Constraints - PowerPoint PPT Presentation

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MultiFrequency Wrapper Design and Optimization for Embedded Cores under Average Power Constraints

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Using level-sensitive scan design (LSSD) scan cells ... the same clock domain and adding lockup- latches between different clock domains ... – PowerPoint PPT presentation

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Title: MultiFrequency Wrapper Design and Optimization for Embedded Cores under Average Power Constraints


1
Multi-Frequency Wrapper Design and Optimization
for Embedded Cores under Average Power
Constraints
Qiang Xu, Nicola Nicolici McMaster
University Krishnendu Chakrabarty Duke
University
2
Outline
  • Research Problem Overview
  • Multi-Frequency Wrapper Design
  • Multi-Frequency Wrapper Optimization
  • Experimental Results
  • Summary

3
SOC with Multiple Clock Domains
4
Scan Design with Multiple Clock Domains
5
Clock Skew during Shift
  • Having separate scan chains for each clock domain
  • Using level-sensitive scan design (LSSD) scan
    cells
  • Grouping flip-flops (FFs) from the same clock
    domain and adding lockup- latches between
    different clock domains

6
Clock Skew during Capture
  • Mask potential hazards using control and/or
    observe points
  • Capture window design ATPG techniques

7
Capture Window Design to Avoid Skew
  • Combinational ATPG
  • High test pattern count

Source http//www.mentor.com/dft/techpapers/
8
Capture Window Design to Avoid Skew
  • Sequential ATPG
  • Low test pattern count

Source http//www.mentor.com/dft/techpapers/
9
At-speed Testing
  • Launch/Capture at rated-speed
  • Scan shifting can be at slower frequency
  • Helps to detect timing-related defects

10
IEEE Std. 1500 Core Test Wrapper
Source Marinissen et al. ITC2000
11
Multi-Frequency Wrapper Design
12
Previous Scan Control Block Design
13
New Scan Control Block Design
14
Previous Timing Diagram
15
New Timing Diagram
16
Multi-Frequency Wrapper Optimization
- Problem Definition
  • Given test set parameters
  • Number of clock domains Nc
  • Ni, No, Nbi, Nsc, SClength, Pi, Nv, for each
    clock domain i
  • Average test power constraint Pave
  • ATE shift frequency ft
  • External TAM width Wext
  • Determine the wrapper design
  • Shift frequency fsi, VTB lines width Wi for each
    clock domain i
  • Wrapper scan chain design

17
Multi-Frequency Wrapper Optimization
- ILP Formulation
  • Suppose the possible shift frequencies for each
    VC are
  • which satisfy
  • Classical min-max ILP formulation
  • Complexity
  • Number of Variables
  • Number of Constraints

18
Multi-Frequency Wrapper Optimization
- Fast Heuristic
  • Initially assume all VTB lines shifting at FM
  • Assign one VTB line to each virtual core
  • Wrapper scan chain design for each
    single-frequency VC
  • Repeat
  • Assign one VTB line to the virtual core with the
    maximum shifting time
  • Select the fs/NVTB that minimizes its overall
    test cost, which considers both shifting time and
    test power consumption

19
Experimental Results Core Config.
20
Experimental Results
21
Experimental Results
22
Summary
  • Wrapper Design for Multi-Frequency Cores
  • 1500-Compliant
  • Avoid clock skew during test
  • Allow different VCs operate at different
    frequencies
  • Wrapper Optimization tradeoff
  • Testing time
  • Routing overhead
  • Average power dissipation
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