Slayt 1

1
Analytical transmission electron microscopy
investigations on the effect of heat treatment
of SiAION ceramics
H Yurdakul S Turan and H Mandal
Anadolu University Dept. of Materials Science
Eng. Iki Eylul Campus Eskisehir 26555 TURKEY
Purpose of Study
Experimental Procedure
XRD Results
Producing SiAlON ceramics
(1)

Triple Junctions/ Secondary Phase or Phases

Explain the composition of triple
junctions/secondary phases and /-SiAlON grains
by using Jeol 2100 F transmission electron
microscope with attached Jeol STEM-HAADF and EDX
dedectors

Heat treatment process to SiAlON ceramics








Characterisation of as-received and heat treated
SiAlON ceramics by using XRD
(2)
Determine the heat treatment effects on to triple
junctions composition by using analytical
electron microscope techniques
Characterisation of as-received and heat treated
SiAlON ceramics by using Jeol 2100F with attached
Jeol STEM-HAADF and EDX dedectors
Heat-Treated /-SiAlON ceramics
As-Received /-SiAlON ceramics
STEM-HAADF Images and EDX Analysis Results of
As-Received /-SiAlON
STEM-HAADF Images and EDX Analysis Results of
Heat-Treated /-SiAlON
Triple Junction
-SiAlON
Secondary Phase
Secondary Phase
a-SiAlON
Composition Y-Sm-Ca-Si-Al-O-N
Composition Y-Si-Al-O-N
Composition Y-Si-Al-O-N
Composition Si-Al-O-N
Composition Y--Si-Al-O-N
Polytype Composition Si-Al-O-N
a-SiAlON
-SiAlON
-SiAlON
Secondary Phase
Triple Junction
Collapse of Triple Junctions
Composition Y-Ca-Si-Al-O-N
Composition Y-Sm-Ca-Si-Al-O-N
Composition Y-Si-Al-O-N
Composition Y-Sm-Ca-Si-Al-O-N
Composition Si-Al-O-N
Composition Si-Al-O-N
EDX Elemental Line Scan Analysis Results of
As-Received /-SiAlON
EDX Elemental Line Scan Analysis Results of Heat
Treated /-SiAlON
Results
Present preliminary research of as-recevied and
heat treated /-SiAlON ceramics were performed
by using EDX analysis with STEM-HAADF images and
XRD techniques. According to these first results
it was seen that secondary phases couldnt be
dedected their elemental constituents by XRD
were present both as-recevied and heat treated
/-SiAlON ceramics in such as Y-Si-Al-O-N.
Triple junctions compositions of both samples
were shown in such as Y-Sm-Ca-Si-Al-O-N and
ittrium was incorparated to -SiAlON structure.
But actually EFTEM 3-window elemental mapping
EFTEM-SI (spectum imaging) STEM-SI and PEELS
(parallel electron energy loss spectrometer
studies sould be performed in future works.
If you would like to take more information
please get in contact to sturan_at_anadolu.edu.tr